CREDENCE SYSTEMS CORPORATION

ACCELERATED VECTOR MODE

automatic test equipment and software for performing testing and diagnostic analysis of electronic components and assemblies such as integrated circuit die, packaged integrated circuits, hybrid circuits, and printed circuit boards;

ASAP

equipment for performing testing and diagnostic analysis of electronic components and assemblies such as integrated circuit die, packaged integrated circuits, hybrid circuits, and printed circuit boards;

ASAP

software for controlling computerized equipment used for performing, testing and diagnostic analysis of electronic components and assemblies such as integrated circuit die, packaged integrated circuits, hybrid circuits, and printed circuit boards;

AVM

equipment and software for performing testing and diagnostic analysis of electronic components and assemblies such as integrated circuit die, packaged integrated circuits, hybrid circuits, and printed circuit boards;

BATCHPROBE

computer hardware, software, and related components for testing, analysis, and diagnosis of semiconductor integrated circuit devices;BATCH PROBE;

BOST

ELECTRONIC HARDWARE FOR MOUNTING ON A LOAD BOARD OR PROBE CARD OF A SEMICONDUCTOR TESTER FOR USE IN PROVIDING ADDITIONAL TEST CIRCUITRY;

BTMA

engineering memory tester; software used in conjunction with an engineering memory tester; load boards, manuals supplied as a unit with an engineering memory tester; manuals supplied as a unit with software used in conjunction with an engineering memory tester; machine readable manuals;

CATNET

semiconductor testers, design verification testers, instrumentation, and parts thereof;CAT NET;

CONCURRENT ALGORITHMIC TEST NETWORK

semiconductor testers, design verification testers, instrumentation, and parts thereof;

EPRO

automated test apparatus for operational testing of non-volatile memories; automated memory cycling apparatus for endurance testing of non-volatile memories; automated programmers for programming non-volatile memories; and software for each of the above;

FIRE PIN

Protocol analyzers;

IDS

computerized unit and software therefor for the testing, analysis and diagnosis of semiconductor integrated circuit devices, and hardware components thereof;

IDS OPTICA

Computerized unit comprised of computer hardware and computer software for use in testing, measurement, failure analysis, and design validation of semiconductor integrated circuits;as to IDS;

IMS

integrated computer system comprised of computers, data processors, signal processors, modems, printers, memory storage units and computer programs for use in verifying the design of integrated circuits;INTEGRATED MEASUREMENT SYSTEMS;The lining shown in the drawing is a feature of the mark but is not meant to indicate color.;

ISOCHRONOUS FABRIC INTERFACE

Computer hardware and software for automatic testing of semiconductor devices;

ITS

computer programs for performing testing and diagnostic analysis of electronic components and assemblies, namely, integrated circuit die, packaged integrated circuits, hybrid circuits, and printed circuit boards;

KALOS

Semiconductor integrated circuit tester and parts thereof, and manuals sold as a unit with the tester and parts;

KEEP ALIVE

automatic test equipment for testing electronic devices and circuits;

KITE

Computer software for controlling operation of a semiconductor integrated circuit tester, and manuals sold as a unit;

MEMBIRA

DESIGN SOFTWARE FOR GENERATING CIRCUIT DESIGNS FOR BUILT-IN REDUNDANCY ANALYSIS CIRCUITRY FOR SEMI-CONDUCTOR MEMORY REPAIR; MANUALS SUPPLIED AS A UNIT WITH SUCH SOFTWARE;

MEMBISR

DESIGN SOFTWARE FOR GENERATING DESIGNS FOR BUILT-IN SELF-REPAIR CIRCUITRY FOR ELECTRONIC CIRCUITS; MANUALS SUPPLIED AS A UNIT WITH SUCH SOFTWARE;

MEMBIST

SOFTWARE FOR GENERATING CIRCUIT DESIGNS FOR BUILT-IN SELF-TEST CIRCUITRY FOR SEMICONDUCTOR MEMORY; MANUALS SUPPLIED AS A UNIT WITH SUCH SOFTWARE;

MEMBOST

design software for use in producing semiconductor hardware mounted on a load board or probe card for providing additional test circuitry; manuals supplied as a unit with such software tools;

MEMTVG

computer software for producing test vectors for testing semiconductor memory devices; manuals supplied as a unit with such software;

NP PLATFORM

Computerized unit for automated testing, failure analysis, and diagnosis of semiconductor integrated circuit devices and hardware components thereof.;PLATFORM;

NPOWER

Computer hardware and software platform for use in automated testing, analysis, and diagnosis of semiconductor integrated circuit devices;N POWER;

NPTEST

TEST;Technical design and consulting services in the field of semiconductor design, development, defect detection and testing;

RAMBOST

DEVICE FOR TESTING SEMICONDUCTOR MEMORY INTERFACE, SOFTWARE FOR CONTROLLING AFORESAID DEVICE, AND MANUALS SOLD AS A UNIT WITH THE FOREGOING GOODS;

SABER

business management in the field of engineering, namely, semiconductor design, manufacture and testing;The English translation of SABER is knowledge.;technical consultation in the field of engineering, namely, semiconductor design, manufacture, and testing; and engineering;

SAPPHIRE

Computer hardware, software and components for use in automatic testing, inspection, analysis, and diagnosis of semiconductor devices and integrated circuits during manufacturing and processing;

SAPPHIRE NP

Computer hardware and software architecture for use in automated testing and analysis of integrated circuits and semiconductor devices;

TRITON

semiconductor integrated circuit testers, and software for operating a semiconductor integrated circuit tester, manuals sold as a unit with semiconductor integrated circuit testers, and manuals sold as a unit with software for operating semiconductor integrated circuit tester;

VALSTAR

semiconductor testers and components therefor; electronic instruments for use with semiconductor testers, namely arbitrary waveform generators, analog capture ports, capture processor boards, reference supply boards and function generators; software for use in conjunction with a semiconductor tester for controlling operation of the tester, for diagnosis and calibration of tester hardware, and for acquisition of test data; and manuals sold as a unit with the software;

VISUAL STIL

Computer programs for providing a visual interface, semiconductor integrated circuit testers equipped with programs for providing a visual interface;VISUAL;

X

automated test apparatus for operational testing of non-volatile memories; automated memory cycling apparatus for endurance testing of non-volatile memories; automated programmer apparatus for programming non-volatile memories; and software for each of the above;

XTOS

Computer software for use in automated testing, analysis, and diagnosis of semiconductor integrated circuit devices;