SEMICONDUCTOR TESTERS

Brand Owner (click to sort) Address Description
CATNET CREDENCE SYSTEMS CORPORATION 1421 California Circle Milpitas CA 95035 semiconductor testers, design verification testers, instrumentation, and parts thereof;CAT NET;
CONCURRENT ALGORITHMIC TEST NETWORK CREDENCE SYSTEMS CORPORATION 1421 California Circle Milpitas CA 95035 semiconductor testers, design verification testers, instrumentation, and parts thereof;
INNOVATION TO REALITY NGR INC. 3-6-7 AZUSAWA 7F NK SHIMURASAKAUE BLDG. ITABASHI-KU, TOKYO 174-0051 Japan SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTORS AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS, NAMELY, VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES;
NANOGEOMETRY TASMIT, INC. 2-6-23 Shin-Yokohama, Kohoku-ku Yokohama, Kanagawa 222-0033 Japan SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTORS AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES;
NGR TASMIT, INC. 2-6-23 Shin-Yokohama, Kohoku-ku Yokohama, Kanagawa 222-0033 Japan SEMICONDUCTOR TESTERS; ELECTRIC METERS FOR INSPECTING SEMICONDUCTOR AND FOR TESTING INTEGRATED CIRCUITS; MAGNETIC METERS NAMELY VOLTMETERS, CHRONOMETERS, DYNAMETERS AND SOUND LEVEL METERS AND VOLTAGE AND AMPERAGE TESTERS AND PROBES FOR TESTING INTEGRATED CIRCUITS; ELECTRON MICROSCOPES;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A test device includes first and second testers each having at least one testing contact for making contact with at least one external contact of an electronic component; and a conveying device that conveys electronic components to the first and second testers in a synchronized manner such that the external contacts of the electronic components form an electrical connection to the testing contacts. Via the testing contacts, it is possible to apply input voltages and input currents to the electronic components and it is possible to measure the voltages, currents and resistances prevailing in the electronic components. The testers check the electronic components on the basis of a predetermined overall set of test criteria or on the basis of subsets of the overall set of test criteria.