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Welcome to the Brand page for “GALAXY AFS-300”, which is offered here for Substrate inspection system, comprising hardware and associated software for measurement of substrates, semiconductor wafers, to determine wafer flatness, shape, thickness, bow wrap and sori, resistivity, conductivity and notch detection;.
Its status is currently believed to be active. Its class is unavailable. “GALAXY AFS-300” is believed to be currently owned by “ADE Corporation”.
| Owner: |
ADE CORPORATION
Owner Details |
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| Description: |
Substrate inspection system, comprising hardware and associated software for measurement of substrates, semiconductor wafers, to determine wafer flatness, shape, thickness, Bow Wrap and SORI, resistivity, conductivity and notch detection;
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| Categories: | SUBSTRATE INSPECTION SYSTEM |