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Brands and Their Owners
| Brand | Owner (click to sort) | Address | Description |
|---|---|---|---|
| GALAXY AFS-300 | ADE Corporation | 80 Wilson Way Westwood MA 020901806 | Substrate inspection system, comprising hardware and associated software for measurement of substrates, namely, semiconductor wafers, to determine wafer flatness, shape, thickness, Bow Wrap and SORI, resistivity, conductivity and notch detection; |
| GALAXY AWIS - 300 | ADE Corporation | 80 Wilson Way Westwood MA 020901806 | Substrate inspection system, comprising non contact optical scanning equipment and associated software for inspecting semiconductor wafers and for detecting and classifying surface defects on wafers, namely, particles and scratches, polishing defects, crystal orientation defects, roughness, edge chips and cracks; |
Where the owner name is not linked, that owner no longer owns the brand |