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Welcome to the Brand page for “XDAL”, which is offered here for Scientific, electrical, optical, monitoring and measuring instruments, instruments for measuring the thickness of layers of electromagnetic radiation; optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness; coating thickness measurement instruments, electrical conductivity measurement instruments, micro hardness measuring instruments, porosity measuring instruments, instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, blank magnetic computer tapes and floppy discs; electromagnetic radiation detectors; spectrometers, x-ray fluorescence spectrometers; semiconductor detectors; color video camera; x-ray detectors; x-ray tubes for scientific laboratory-purposes; data processors; computers; measuring apparatus and instruments, programmable x-y stages, computer hardware and computer software for measuring objects; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results;.
Its status is currently believed to be active. Its class is unavailable. “XDAL” is believed to be currently owned by “HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK”.
| Owner: |
HELMUT FISCHER GMBH INSTITUT FUR ELEKTRONIK UND MESSTECHNIK
Owner Details |
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| Description: |
Scientific, electrical, optical, monitoring and measuring instruments, instruments for measuring the thickness of layers of electromagnetic radiation; optical instruments for measuring the diffraction, refraction, absorption, luminescence, scattering, and reflection phenomena for the determination of layer thickness; coating thickness measurement instruments, electrical conductivity measurement instruments, micro hardness measuring instruments, porosity measuring instruments, instruments for measuring thickness of coatings, alloy composition, material analysis, porosity, electrical conductivity, ferrite content, microhardness, and other properties of coatings and layers; magneto-, opto-electronic data recording media, blank magnetic computer tapes and floppy discs; electromagnetic radiation detectors; spectrometers, x-ray fluorescence spectrometers; semiconductor detectors; color video camera; X-ray detectors; x-ray tubes for scientific laboratory-purposes; data processors; computers; measuring apparatus and instruments, programmable x-y stages, computer hardware and computer software for measuring objects; computer software for use in controlling the scientific, electrical, optical, and monitoring parameters of measuring instruments and to analyze and evaluate, transmit and process the results;
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| Categories: | SCIENTIFIC |