PIXIRAD

Welcome to the Brand page for “PIXIRAD”, which is offered here for Scientific, measuring and detecting apparatus and instruments, spectrometers, x-ray fluorescence analysers and spectrometers, diffractometers, x-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; x-ray detecting apparatus and instruments; x-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; x-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, x-ray diffraction and spectrometry apparatus, diffractometers, x-ray diffractometers, x-ray analysers, x-ray fluorescence spectrometers, wafer analysers, x-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, spectrometers, x-ray fluorescence analysers and spectrometers, diffractometers, x-ray diffractometers and wafer analysers; x-ray apparatus not for medical use; analytical, process control and measuring apparatus, reflectometers, spectrometers, x-ray fluorescence analysers and x-ray diffraction meters; analytical, process control and measuring apparatus, reflectometers, spectrometers, x-ray fluorescence analysers and x-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, reflectometers, spectrometers, x-ray fluorescence analysers and x-ray diffraction meters; reflectometers, spectrometers, x-ray fluorescence analysers and x-ray diffraction meters for both silicon and compound semiconductor applications; x-ray fluorescence wafer and disc analysers, and automated ellipsometers; x-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; x-ray diffraction instruments, including x-ray diffraction meters for the compound semiconductor industry; x-ray tubes, not for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to x-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of x-ray intensities; downloadable or recorded computer software for use in relation to x-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods;.

Its status is currently believed to be active. Its class is unavailable. “PIXIRAD” is believed to be currently owned by “MALVERN PANALYTICAL B.V.”


Owner:
MALVERN PANALYTICAL B.V.
Owner Details
Description:
Scientific, measuring and detecting apparatus and instruments, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers, neutron activation analysers, pulsed fast and thermal neutron activation analysers; X-ray detecting apparatus and instruments; X-ray measuring, detecting and monitoring instruments, indicators and controllers not for medical purposes; X-ray detectors not for medical purposes; analytical apparatus for use in analysing samples of composites for use in scientific, industrial and laboratory applications, X-ray diffraction and spectrometry apparatus, diffractometers, X-ray diffractometers, X-ray analysers, X-ray fluorescence spectrometers, wafer analysers, X-ray tubes; materials characterization apparatus in the nature of scientific and measuring apparatus and instruments, spectrometers, X-ray fluorescence analysers and spectrometers, diffractometers, X-ray diffractometers and wafer analysers; X-ray apparatus not for medical use; analytical, process control and measuring apparatus, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; analytical, process control and measuring apparatus, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for the cement, steel, aluminium, petrochemicals, industrial minerals, glass and polymers industry, and to customers in research and development institutions; metrology tools, reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters; reflectometers, spectrometers, X-ray fluorescence analysers and X-ray diffraction meters for both silicon and compound semiconductor applications; X-ray fluorescence wafer and disc analysers, and automated ellipsometers; X-ray fluorescence wafer and disc analysers and automated ellipsometers for the silicon semiconductor industry, for analysing film thickness, composition and density; diffraction apparatus for microscopy; diffraction apparatus and instruments; X-ray diffraction instruments, including X-ray diffraction meters for the compound semiconductor industry; X-ray tubes, not for medical purposes; downloadable or recorded computer software for use in relation to spectrometry; downloadable or recorded computer software for analysis purposes; downloadable or recorded computer software for use in relation to diffractometry; downloadable or recorded computer software for use in relation to X-ray fluorescence analysis; downloadable or recorded computer software for use in relation to the determination of X-ray intensities; downloadable or recorded computer software for use in relation to X-ray diffraction analysis for use with x-ray apparatus not for medical use; component parts and fittings for all the aforesaid goods;
Categories: SCIENTIFIC