ZYGO CORPORATION

ACCUFLAT

Interferometer;ACCURATE FLAT;

AXIOM 2/20

LASER MEASUREMENT SYSTEMS -NAMELY, INTERFEROMETERS COMPRISING A LASER HEAD, BEAM DIRECTING AND SPLITTING OPTICS, MEASUREMENT OPTICS, RECEIVERS AND WAVELENGTH COMPENSATORS;

BEYOND PRECISION

Optical and electro-optical measuring devices and components thereof, namely, optical gauges, interferometers, prisms, optical flats, optical mirrors, beam splitters for splitting light from a laser into multiple paths, optical windows, optical retroflectors, beam expanders in the nature of an optical device used for expanding the size of a laser beam, optical laser amplifier optics, lasers being part of optical and electro-optical measuring devices, laser tubes being part of optical and electro-optical measuring devices, laser amplifier slabs being part of optical and electro-optical measuring devices, optical lenses, transmission spheres for measuring the surface quality or transmitted wavefront of concave or convex surfaces or optics, transmission flats for measuring the surface quality or transmitted wavefront of flat optical components and assemblies, reference flats used to test the flatness of surfaces, optical attenuation filters, optical mirror mounts, and optical-mechanical assemblies; interferometers; optical profilers; metrology systems comprised of a light source, one or more cameras and sensors in communication with external computer software and hardware goods and replacement parts therefor;Engineering design services; Product development; Design and engineering services namely, design and engineering of optical metrology systems and optical components and assemblies in the field of metrology and optics;

CLEARSHOT

Automated process control mechatronics system, namely, micro-processor based hardware and computer application software used to monitor the status of industrial processes, namely, flat panel display manufacturing;CLEAR SHOT;

DROPSHOT

Automated process control mechatronics systems, namely, micro-processor based hardware and computer application software used to monitor the status of industrial processes, namely, flat panel display manufacturing;DROP SHOT;

DYNAFIZ

laser interferometer;

DYNAPHASE

Interferometers;DYNAMIC PHASE;

DYNAPHASE

Downloadable software for data acquisition for use in connection with interferometers;

DYNAPHASE

Downloadable software for data acquisition for use in connection with interferometers;DYNA PHASE;

ENABLING THE PETA ERA

MICRO-OPTICAL COMPONENTS, NAMELY, LENSES, BALL LENSES, LENS ARRAYS, MIRRORS, PRISMS, BEAM SPLITTERS, FIBER OPTIC ARRAYS, COLLIMATORS, COLLIMATOR ARRAYS FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; MICRO-BALL LENSES AND MICRO-LENSES FOR USE IN FIBER OPTIC APPLICATIONS AND WITH ARRAYED WAVE GUIDES; OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS; MICRO-OPTICAL ASSEMBLIES, AND FIBER OPTIC ASSEMBLIES FOR USE IN OPTICAL NETWORKS; MICRO-OPTICAL MODULES FOR FIBER OPTIC NETWORKS AND SYSTEMS, MICRO-OPTIC INTERFEROMETERS FOR USE IN THE MEASUREMENT OF DEVIATION OF SURFACE SHAPE; DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; ATMOSPHERIC INSENSITIVE DISTANCE MEASURING INTERFEROMETERS, NAMELY LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS FOR USE WITH THE ELECTRONICS BOARD THAT PROCESSES ELECTRONIC MEASUREMENT SIGNALS GENERATED BY THE PHOTO DETECTOR; RETICLE CRITICAL DIMENSION MEASURING EQUIPMENT PROVIDING NON-CONTAMINATED HANDS-OFF RETICLE MEASUREMENT AND INSPECTION; IN-PROCESS SILICON WAFER SURFACE TOPOGRAPHY MEASURING EQUIPMENT FOR USE IN PRECISION MEASUREMENT OF SILICON WAFER TOPOGRAPHY; OPTICAL DATA STORAGE HEADS AND DRIVES; SURFACE METROLOGY EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE HEADS AND SLIDERS; AND SURFACE EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE DISKS;

ENABLING THE TERA ERA

Micro-optical components, namely lenses, ball lenses, lens arrays, mirrors, prisms, beam splitters, fiber optic arrays, collimators, collimator arrays for use in the field of fiber optics; micro-ball lenses and micro-lenses for use in the field of fiber optics; micro-optical assemblies, and fiber-optic assemblies for use in optical networks; micro-optic interferometers for use in the measurement of deviation of surface shape; distance measuring interferometers, namely laser heads, interferometers, processing electronics for use with the electronics board that processes electronic measurement signals generated by the photodetector; atmospheric insensitive distance measuring interferometers, namely laser heads, interferometers, processing electronics for use with the electronics board that processes electronic measurement signals generated by the photodetector; reticle critical dimension measuring equipment for use in fiber optic applications; in-process silicon wafer surface topography measuring equipment for us in fiber optic applications; optical storage heads and drives; surface metrology equipment for the measurement of magnetic rigid disk drive disks;

LIVEPHASE

Software for data acquisition and displaying 3D real-time wavefront data for use in connection with interferometers;LIVE PHASE;

LIVEPHASE

A data measurement feature sold as a component of downloadable software for data acquisition and displaying 3D real-time wavefront data for use in connection with interferometers;LIVE PHASE;

MAXIM-3D

LASER INTERFEROMETRIC MICROSCOPES;MAXIM-DDD; 3D;

MESA

interferometer;

METROPRO

software for analysis and display of information from metrology devices;METROLOGY PRO;

METROPROX

Software for analysis and display of information from metrology devices;METRO PRO X;

NEWVIEW

optical profiler for measuring surface topography and film thickness;NEW VIEW;

ONESHOT

Automated process control mechatronics system, namely, micro-processor based hardware and computer application software used to monitor the status of industrial processes, namely, flat panel display manufacturing;ONE SHOT;

PETA ERA

--MICRO-OPTICAL COMPONENTS, MICRO-BALL LENSES, MICRO-LENSES, OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS, MICRO-OPTICAL ASSEMBLIES, FIBER OPTIC ASSEMBLIES, MICRO-OPTICAL MODULES FOR FIBER OPTIC NETWORKS AND SYSTEMS, MICRO-OPTIC INTERFEROMETERS, MICRO-OPTIC WAVE FRONT SENSORS AND MICRO-OPTIC ASSEMBLY EQUIPMENT, DISTANCE MEASURING INTERFEROMETERS INCLUDING LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS, ATMOSPHERIC INSENSITIVE DISTANCE MEASURING INTERFEROMETERS INCLUDING LASER HEADS, INTERFEROMETERS, PROCESSING ELECTRONICS, RETICLE CRITICAL DIMENSION MEASURING EQUIPMENT IN-PROCESS SILICON WAFER SURFACE TOPOGRAPHY MEASURING EQUIPMENT, OPTICAL DATA STORAGE HEADS AND DRIVES, SURFACE METROLOGY EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC HARD DISK DRIVE HEADS (SLIDERS), SURFACE TOPOGRAPHY EQUIPMENT FOR THE MEASUREMENT OF MAGNETIC RIGID DISK DRIVE DISKS;

PETAOPTIX

MICRO-OPTICAL COMPONENTS, MICRO-BALL LENSES, MICRO-LENSES, OPTICAL SWITCHES, OPTICAL FILTERS, TUNABLE OPTICAL FILTERS, MICRO-OPTICAL ASSEMBLIES, FIBER OPTIC ASSEMBLIES, MICRO-OPTICAL MODULES FOR FIBER OPTIC NETWORKS AND SYSTEMS, MICRO-OPTIC INTERFEROMETERS, MICRO-OPTIC WAVEFRONT SENSORS AND MICRO-OPTIC ASSEMBLY EQUIPMENT;

SIMETRA

METROLOGY TOOL FOR SIMULTANEOUS MEASUREMENT OF RELATIVE GEOMETRIC SURFACES;

SIMETRA

Metrology tool for simultaneous measurement of relative geometric surfaces;

SMARTAVERAGING

Instrument control and data analysis software featuring automatic calculation capabilities to ensure accurate measurements by reducing the effects of random noise sources for use with optical profilers and laser interferometers;SMART AVERAGING;

SURESHOT

Automated process control mechatronics system, namely, micro-processor based hardware and computer application software used to monitor the status of industrial processes, namely, flat panel display manufacturing;SURE SHOT;

TERA ERA

Micro-optical components, micro-ball lenses, micro-lenses, optical switches, optical filters, tunable optical filters, micro-optical assemblies, fiber optic assemblies, micro-optical modules for fiber optic networks and systems, micro-optic interferometers, micro-optic wavefront sensors and micro-optic assembly equipment, distance measuring interferometers including laser heads, interferometers, processing electronics, atmospheric insensitive distance measuring interferometers including laser heads, interferometers, processing electronics, reticle critical dimension measuring equipment in-process silicon wafer surface topography measuring equipment, optical data storage heads and drives, surface metrology equipment for the measurement of magnetic hard disk drive heads (sliders), surface topography equipment for the measurement of magnetic rigid disk drive disks;

VERSA

laser interferometer;

Z

The mark consists of a black capital Z with a red horiztonal line directly below it.;The color(s) red and black is/are claimed as a feature of the mark.;Engineering design services; Product development; Design and engineering services in the field of metrology and optics;