XENOCS SAS

INXIGHT

Measuring apparatus and instruments; scientific apparatus and instruments; sensor; laboratory apparatus and instruments; laboratory equipment; measuring, regulating and testing apparatus; display and checking (supervision) apparatus; apparatus and instruments for industrial process monitoring and control; parts and fittings for the above goods; software and computer hardware; all of the aforesaid goods being specifically in connection with x-ray apparatus, in particular with x-ray radiography apparatus or x-ray imaging not for medical purposes, in particular in combination with small-angle x-ray scattering and/or wide-angle x-ray scattering; all of the aforesaid goods being specifically used for materials research, development or production control in the field of polymers, nanocomposites, biomaterials, alloys, in particular for analysis of the macrostructure at several microns to centimeter scale, in particular for detection of structural inhomogeneities, defects, voids, pores, aggregations, interfaces in such materials;

XEUSS

Arranging and conducting of symposiums; arranging and conducting of congresses; arranging and conducting conferences and seminars; archive library services; computer based library services; electronic library services; arrangement of training courses in teaching institutes; arranging and conducting of colloquiums; workshops (arranging and conducting of -) [training]; computer training; conducting instructional courses; conducting of educational courses in science; courses (training -) relating to science; courses (training -) relating to engineering; correspondence courses; postgraduate training courses; rental and leasing in relation to the aforesaid services, included in this class; consultancy and information in relation to the aforesaid services, included in this class; all the aforesaid services in particular relating to small-angle x-ray scattering for examining material structures, in particular in combination with wide-angle x-ray scattering for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis;Measuring, detecting and monitoring instruments, indicators and controllers, namely, small angle x-ray scattering instruments and wide angle x-ray scattering instruments; optical devices, enhancers and correctors, namely, spectrometers; scientific research and laboratory apparatus, educational apparatus and simulators, namely, x-ray apparatus, not for medical purposes; radiological apparatus for industrial purposes, namely, small angle x-ray scattering instruments and wide angle x-ray scattering instruments; x-ray analyzers, other than for medical purposes, used for analyzing crystalline structure of nanomaterials and for examining nanoscale properties of materials such as shape and size of structures; small angle and wide angle x-ray scattering instruments used separately or in combination for examining crystal properties for materials research and development or for analyzing the shape, sizes, molecular weight, interactions, aggregation and conformational state of proteins, rna or biological macromolecules in solution; particle detecting apparatus, namely, x-ray scattering instruments for measuring nanoscale particle size analysis in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, liquid crystals, protein solutions and thin nanostructured films; x-ray detection apparatus, visible light detection apparatus, infrared detection apparatus and uv detection apparatus; electronic sensors; electro-optical sensors; interfaces for detectors; magnetic object detectors; optical sensors; small angle and wide angle x-ray scattering instruments for measuring nanoscale particle sizes; photoelectric sensors; photoionic detectors; measuring devices, electric, namely, clamp meters for measuring electricity; instruments for surveying physical data; radiation-measuring instruments; optical time-domain reflectometers; scientific apparatus, namely, spectrometers; data processing equipment, namely, couplers, computers; computer software, in particular for scientific applications, in particular for structure modelling of nanomaterials; x-ray producing apparatus and installations, not for medical purposes; radiological apparatus for industrial purposes; x-ray analysers, other than for medical purposes; scientific apparatus and instruments, in particular small-angle x-ray scattering instruments for examining material structures, in particular in combination with wide-angle x-ray scattering instruments for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis; structural and replacement parts and fittings for all the aforesaid goods, included in this class;Advisory services relating to science; advisory services relating to scientific instruments; analytical laboratory services; calibration of instruments; professional consultancy relating to technology; industrial research; laboratory research and testing services; leasing of scientific instruments; rental of measuring apparatus; preparation of technical project studies and analysis; preparation of reports relating to scientific research; preparation of technical manuals; providing scientific and technological information; provision of scientific information; product research and development services; research in instrumentation; research in measurement technology; scientific consulting; scientific and technological research services; rental and leasing in relation to the aforesaid services, included in this class; consultancy and information in relation to the aforesaid services, included in this class; all the aforesaid services in particular relating to small-angle x-ray scattering for examining material structures, in particular in combination with wide-angle x-ray scattering for examining crystal properties, in particular for materials research in the field of nanomaterials, polymers, soft matter, colloids, complex fluids, including liquid crystals, protein solutions, thin nanostructured films, and particle size analysis;