NANOWORLD AG

ADVANCEDTEC ADVANCED TIP AT THE END OF THE CANTILEVER

Sensors and probes for atomic force microscopy, scanning probe microscopy;ADVANCED TIP AT THE END OF THE CANTILEVER;CANTILEVER;

ARROW

Sensors and probes and parts thereof for non-optical microscopes and near-field optical microscopes; micromechanical and microelectrical instruments and apparatus for surface and equipment characteristics detection; sensors and probes and parts thereof for high-power scanning microscopy, scanning probe microscopy and scanning electron microscopy; sensors comprising micromechanical slides and membranes; scanning instruments and sensors and parts thereof for determining and measuring surfaces and equipment characteristics;

BUDGETSENSORS

[ Scanning probe microscopes, scanning electronic microscopes and atomic force microscopes; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for non-optical microscopes and optical near field microscopes; [ electric and electronic and micro-mechanical and micro-electromechanical instruments and apparatus for detection of pressure, gases, temperature, intensity of light, forces, acceleration, vibrations, nick angle, humidity, distances, speed, roughness, thickness, acoustic waves, and molecules for measuring surface topography, height, electrical and magnetical surface properties,potentials and currents, and for applying electromagnetic irradiation, temperatures, mechanical, electrical and magnetical forces, currents and potentials to a substrate; ] electric and electronic and micro-mechanical and micro-electromechanical sensors and probes for atomic force microscopy, for scanning probe microscopy, and for scanning electronic microscopy; electric and electronic and micro-mechanical and micro-electromechanical sensors comprised of micro-mechanical cantilevers and membranes;BUDGET SENSORS;

DATAPROBE

Cantilevers for microscopes;DATA PROBE;Scientific research, industrial research, namely chemical research, mechanical research, medical research and product research; intellectual property consultation; consultation and research in the field of engineering; design for others in the field of engineering; licensing of intellectual property;

HI'RES

The mark consists of a ball with an arc crossing the ball and the word HI'RES appearing to the right of the ball.;Cantilevers for microscopes;HIRES;Color is not claimed as a feature of the mark.;