HERMES MICROVISION, INC.

ESCAN

1; Measuring apparatus, namely, instruments for use in the semiconductor industry 2; Probes for testing integrated circuits 3; Computer software to enhance the yield productivity of semiconductors 4; Optical inspection apparatus for industrial use 5; Data processors 6; Industrial process control software 7; Visual instruments for examining semiconductor apparatus 8; Inspection instruments [other than for medical or dentist use] 9; Wafer steppers for adjusting the production of integrated circuits, Wafer steppers for controlling the production of integrated circuits and Wafer steppers for monitoring the production of integrated circuits 10; Computer programs for use in computer-aided manufacturing/Computer programs for integrated circuits diagnostics;

NANOSCAN

NANO SCAN;Quality control for others of semiconductor manufacturing using particle beam;