CARL ZEISS MICROSCOPY GMBH

AIRYSCAN

Laser scanning microscopes and parts thereof;AIRY SCAN;

ALIS

Electron microscopes and parts thereof;

APEER

APPEAR;A PEER;Providing platform as a service (PAAS) services featuring computer software that connects microscopy software developers with microscope users, and that permits microscope users to store and access their data, create and share software modules for performing data analysis and image processing tasks, access and use the software modules shared by other microscope users, and communicate and collaborate with other microscope users; all the foregoing in the field of microscopy;

APEER

Downloadable computer software for performing data analysis and image processing tasks in the field of microscopy; downloadable databases in the field of microscopy; Downloadable computer software platforms that connect microscopy software developers with microscope users, and that permit microscope users to acquire, store and access their data, create and share software modules for performing data analysis and image processing tasks, access and use the software modules shared by other users, and communicate and collaborate with other users in the field of microscopy; optical apparatus and instruments, namely, microscopes and parts and fittings therefor in the field of microscopy;

ASB

[ Electron microscopes and their parts ] * Electron microscopes parts *;

ATLAS

Software to facilitate imaging of electron microscopes with nanometer resolution, for use only in the life sciences;

AURIGA

Electron microscopes and parts thereof;

AXIOSCOPE

Microscopes and parts thereof;

AXIOSKOP

MICROSCOPES AND PARTS THEREOF;

CENTRA

Electron microscopes and parts thereof;

DIGIVERT

Microscopes and their parts;

DUAL GUN

Electron microscopes and parts thereof;

EASYVP

Electron microscopes and parts thereof;EASY VP;

EIGMA

The mark is presented in special form. The mark consists of the designation EIGMA, consisting of the upper case Greek letter sigma followed by the upper case Latin letters IGMA.;Electron Microscopes and parts thereof;Color is not claimed as a feature of the mark.;

EVO

Electron microscopes and parts thereof;

FILMDETECT

Spectrometers and parts thereof;FILM DETECT;

FILMDETECT

Spectrometers and parts thereof;FILM DETECT;

GEMINI

ELECTRON MICROSCOPES;

INLENSDUO

Electron microscopes and parts thereof;IN LENS DUO;

INSTANT VOLUME

Downloadable software for acquiring, analyzing, interpreting, and storing data and images, all in the field of laserscanning microscopes;

INTELLESIS

Computer software for machine learning;

ION-SCULPTOR

Microscopes and parts thereof; electron microscopes and parts thereof;

IPSEM

Electron microscopes and parts thereof;

JETSCAN

analyzers for analyzing debris specimens from engines, electron microscopes, electron detectors for electron microscopes, computer software for performing image analysis, X-ray detectors for identifying debris produced by engines in the field of engine analysis, and parts for all the aforesaid goods;JET SCAN;

KRONOS

Electron microscopes and parts thereof;

LABSCOPE

Downloadable imaging software for connected microscopy;LAB SCOPE;

OPTIRECON

Software used for tomographic imaging;OPTI RECON;

ORION

Microscopes to be used in helium ion microscopy;

PHAME

Phase metrology system comprised of a laser, homogenizer, polarizer, an objective, and a camera, used in the semiconductor industry to analyze lithographic photo masks;PHASE METROLOGY; FAME;

SIGMA

Scanning electron microscope;

SMARTION

Electron microscopes and parts thereof; software intended to control said microscopes and to display and treat the images they provide;SMART ION;

SMARTPI

Software to operate an electron microscope;

SMARTZOOM

Microscopes and parts thereof not used in the medical field;SMART ZOOM;

THINPROCESS

Spectrometers; software used in the field of process monitoring for thin film analysis;THIN PROCESS;

ZEN CONNECT

Imaging software for structural analysis, examination of cellular processes, image overlay and image alignment, all in the field of light and electron microscopy; electronic databases in the field of light and electron microscopy recorded on computer media;