TEST PROBE ELECTRICAL CONTACTS

Brand Owner (click to sort) Address Description
ACCUMAX WINWAY TECHNOLOGY CO., LTD. No. 68, Chuangyi S. Rd. Sec. Dist. of Nepz, Nanzih Dist. Kaohsiung 81156R.O. Taiwan Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and the like; electrical testing equipment, namely, probe cards, probe card interfaces and fixtures to facilitate testing of integrated circuits;ACCOUNT MAX;
COBRA WINWAY TECHNOLOGY CO., LTD. No. 68, Chuangyi S. Rd. Sec. Dist. of Nepz, Nanzih Dist. Kaohsiung 81156R.O. Taiwan test probe electrical contacts and holder therefor, for probing integrated circuits, semi-conductor devices and the like;
MACROMAX Wentworth Laboratories, Inc. 500 Federal Road Brookfield CT 06804 Test probe electrical contacts and holders therefor and test probe high current large electrical contacts and holders therefore, for probing integrated circuits, and semiconductor devices; electrical testing equipment, namely, probe cards, and probe card interfaces to facilitate testing of integrated circuits;MACRO MAX;
MEGAMAX WINWAY TECHNOLOGY CO., LTD. No. 68, Chuangyi S. Rd. Sec. Dist. of Nepz, Nanzih Dist. Kaohsiung 81156R.O. Taiwan Test probe electrical contacts and holders therefor and test probe high current large electrical contacts and holders therefore, for probing integrated circuits, semiconductor devices and the like; electrical testing equipment, namely, probe cards, probe card interfaces and fixtures to facilitate testing of integrated circuits;MEGA MAX;
MICROMAX WINWAY TECHNOLOGY CO., LTD. No. 68, Chuangyi S. Rd. Sec. Dist. of Nepz, Nanzih Dist. Kaohsiung 81156R.O. Taiwan Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and the like; electrical testing equipment, namely, probe cards, probe card interfaces and fixtures to facilitate testing of integrated circuits;
ROUTE60 TECHNOPROBE S.p.A. 89, Barnes Place Colombo 7 Sri Lanka Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and specialty electronic devices; electrical testing equipment, namely, probe cards, probe card interfaces, and fixtures in the nature of probers, manipulators, needle holder assemblies, computer assisted probes and edge sensors used to facilitate testing of integrated circuits;ROUTE 60;Color is not claimed as a feature of the mark.;
SABER WINWAY TECHNOLOGY CO., LTD. No. 68, Chuangyi S. Rd. Sec. Dist. of Nepz, Nanzih Dist. Kaohsiung 81156R.O. Taiwan Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and the like; electrical testing equipment, namely, probe cards, probe card interfaces and fixtures to facilitate testing of integrated circuits;
TECHNOPROBE TECHNOPROBE S.p.A. 89, Barnes Place Colombo 7 Sri Lanka Test probe electrical contacts and holders therefor, for probing integrated circuits, semiconductor devices and specialty electronic devices; electrical testing equipment, namely, probe cards, probe card interfaces, and fixtures in the nature of probers, manipulators, needle holder assemblies, computer assisted probes and edge sensors used to facilitate testing of integrated circuits;TECHNO PROBE;Color is not claimed as a feature of the mark.;Research, design and development of printed circuit boards (PCBs) and electronic cards;
VENOM Wentworth Laboratories, Inc. 500 Federal Road Brookfield CT 06804 Test probe electrical contacts and holder, therefor, [ tor ] * for * probing integrated circuits, semi-conductor devices and the like;IN THE STATEMENT, COLUMN 1, LINE 6, TOR SHOULD BE DELETED, AND, FOR SHOULD BE INSERTED.;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method and apparatus for achieving a very fine pitch interconnect between a flexible circuit member and another circuit member with extremely co-planar electrical contacts that have a large range of compliance. An electrical interconnect assembly that can be used as a die-level test probe, a wafer probe, and a printed circuit probe is also disclosed. The second circuit member can be a printed circuit board, another flexible circuit, a bare-die device, an integrated circuit device, an organic or inorganic substrate, a rigid circuit and virtually any other type of electrical component. A plurality of electrical contacts are arranged in a housing. The electrical contacts may be arranged randomly or in a one or two-dimensional array. The housing acts as a receptacle to individually locate and generally align the electrical contacts, while preventing adjacent contacts from touching. The first ends of the electrical contacts are electrically coupled to a flexible circuit member. The second ends of the electrical contacts are free to electrically couple with one or more second circuit members without the use of solder.