TEST MEASUREMENT EQUIPMENT

Brand Owner (click to sort) Address Description
AGILENT EXT AGILENT TECHNOLOGIES, INC. 5301 Stevens Creek Boulevard Santa Clara CA 95051 Test and measurement equipment, namely, one box testers containing a signal source and a signal analyzer for testing microwave and wireless communication devices and designs;
AGILENT MXT AGILENT TECHNOLOGIES, INC. 5301 Stevens Creek Boulevard Santa Clara CA 95051 Test and measurement equipment, namely, one box testers containing a signal source and a signal analyzer for testing microwave and wireless communication devices and designs;
AGILENT PXT AGILENT TECHNOLOGIES, INC. 5301 Stevens Creek Boulevard Santa Clara CA 95051 Test and measurement equipment, namely, one box testers containing a signal source and a signal analyzer for testing microwave and wireless communication devices and designs;
EPA ANRITSU COMPANY 490 Jarvis Drive Morgan Hill CA 95037 Test and measurement equipment in the nature of digital pattern generators and digital communication analyzers for high speed digital communications;
EXT KEYSIGHT TECHNOLOGIES, INC. 1400 Fountaingrove Pkwy Santa Rosa CA 95403 Test and measurement equipment, namely, one box testers containing a signal source and a signal analyzer for testing microwave and wireless communication devices and designs;
EYE PATTERN ANALYZER ANRITSU COMPANY 490 Jarvis Drive Morgan Hill CA 95037 Test and measurement equipment in the nature of digital pattern generators and digital communication analyzers for high speed digital communications;
HOLZWORTH Holzworth Instrumentation, Inc. 2540 Frontier Ave, STE 200 Boulder CO 80301 Test and measurement equipment, namely, signal generators, RF synthesizers, frequency sources, spectrum analyzers, base band analyzers, RF power meters, phase noise test systems, frequency modulation units, and frequency time base units; electronic components, namely, amplifiers, filters, comb generators, switches, mixers, phase detectors, up converter modules, down converter modules, frequency multipliers, frequency dividers and power supplies; downloadable computer programs to control test and measurement equipment and electronic components directly via a computer or via the Internet and world wide web;
METER CENTER Lovelace, Thomas A. 825 W. Queen Creek Rd Suite 2118 Chandler AZ 85248 Test and Measurement Equipment;
MXT AGILENT TECHNOLOGIES, INC. 5301 Stevens Creek Boulevard Santa Clara CA 95051 Test and measurement equipment, namely, one box testers containing a signal source and a signal analyzer for testing microwave and wireless communication devices and designs;
PQM Monitoring Technology Corporation 2731 Prosperity Ave Suite B Fairfax VA 220314308 test and measurement equipment for analyzing signals from mechanical systems with rotating components and for detecting changes therein;
PREDICTIVE QUALITY MONITOR Monitoring Technology Corporation 2731 Prosperity Ave Suite B Fairfax VA 220314308 test and measurement equipment for analyzing signals from mechanical systems with rotating components and for detecting changes therein;
PXT KEYSIGHT TECHNOLOGIES, INC. 1400 Fountaingrove Pkwy Santa Rosa CA 95403 Test and measurement equipment, namely, one box testers containing a signal source and a signal analyzer for testing microwave and wireless communication devices and designs;
SIGNATURE ANRITSU COMPANY 490 Jarvis Drive Morgan Hill CA 95037 TEST AND MEASUREMENT EQUIPMENT IN THE NATURE OF A SIGNAL ANALYZER FOR COMMUNICATIONS;
ZSCOPE TERADYNE, INC. 600 Riverpark Drive North Reading MA 01864 Test and measurement equipment and software, namely, oscilloscopes;ZTEC SCOPE;
ZWAVE TERADYNE, INC. 600 Riverpark Drive North Reading MA 01864 Test and measurement equipment, namely, automated waveform generators and software for operating automated waveform generators;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An apparatus and method for on-chip bias measurement of an analog signals on an integrated circuit with a switchable analog-to-digital converter capable of performing testing and other types of processing. Analog signal test locations are selected for testing by a test input selector which is in turn controlled by a controller on an integrated circuit, such as an imager chip. Test locations are connected to one or more analog-to-digital converters through the test input selector. The analog-to-digital converter(s) output a test measurement digital output to either test equipment or an on-chip calibration circuit. Test equipment or on-chip calibration circuits adjusts imager component bias or other operating parameters used in chip or device operation based on output from the analog-to-digital converter(s).