TEST DEVICE USED CHECK

Brand Owner (click to sort) Address Description
LINACHECK PTW-New York Corporation 140 58th Street, Suite 5H-3 Brooklyn NY 11220 Test device used to check the radiation output of medical radiation therapy treatment machines;
OCTAVIUS PTW-NEW YORK 205 Park Avenue Hicksville NY 11801 Test device used to check the radiation output of medical radiation therapy treatment machines;
PTW-CONNY PTW-New York Corporation 140 58th Street, Suite 5H-3 Brooklyn NY 11220 Test device used to check the radiation output of diagnostic x-ray machines in hospitals;
QC6PLUS PTW-New York Corporation 140 58th Street, Suite 5H-3 Brooklyn NY 11220 Test device used to check the radiation output of medical radiation therapy treatment machines;
QUICKCHECK PTW-NEW YORK 205 Park Avenue Hicksville NY 11801 Test device used to check the radiation output of medical radiation therapy treatment machines;QUICK CHECK;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An integrated circuit device can be tested using a built-in test circuit, in the IC device, that tests the operation of an I/O cell. The built-in test circuit includes a pattern generator for generating a series of simulation signals. The built-in test circuit successively stores and retrieves the simulation signals from an I/O buffer of the I/O cell. For each iteration of storing and retrieving, test logic of the built-in test circuit compares the stored and retrieved data to check whether the data matches. If a mismatch is detected, the test logic issues a fail signal. The fail signal can cause a unique signal at the pad of the I/O cell that alerts a tester to the failure of the IC device. The fail signal can also cause the issuance of a device failure signal that can be detected at other pins of the IC device.