SURFACE INSPECTION APPARATUS DEFECT

Brand Owner (click to sort) Address Description
CLECIM SIAS SIEMENS VAI METALS TECHNOLOGIES SAS 51 rue Sibert SAINT CHAMOND F42400 France Surface inspection apparatus and defect detection apparatus for long metallurgical and iron and steel products, for bands and sheets, namely, image acquisition cameras, electronic circuits for real time image acquisition interfaces, color cameras, charge-coupled device photo-electric sensors for self-emitted infrared light and for reflected visible light, charge-coupled device digital cameras and real time interface circuits for charge-coupled device digital cameras, calculators for image acquisition, image display apparatus, namely, video screens and computer screens; real time image acquisition software, image recognition software, pattern recognition software, color recognition software, image contrast recognition software, data sorting software and data classification software for use with the aforementioned surface inspection apparatuses and defect detection apparatuses;Machine tools, namely, metalworking machine tools; machines, namely, electric machines for moving or positioning image acquisition apparatus;LED striplights;Computer programming;
SIAS CLECIM SAS 41 route de Feurs, CS 50099 France Surface inspection apparatus and defect detection apparatus for metallurgical and iron and steel products, for bands and sheets, namely, image acquisition cameras, electronic circuits for real time image acquisition interfaces, color cameras, charge-coupled device photo-electric sensors for self-emitted infrared light and for reflected visible light, charge-coupled device digital cameras and real time interfaces for charge-coupled device digital cameras, calculators for image acquisition, image display apparatus, namely, video screens and computer screens; real time image acquisition software, image recognition software, pattern recognition software, color recognition software, image contrast recognition software, data sorting software and data classification software for use with the aforementioned surface detection apparatuses and defect detection apparatuses;Machine tools, namely, metalworking machine tools; machines, namely, electric machines for moving or positioning image acquisition apparatus;LED striplights;Computer programming;
VAI SIAS SIEMENS VAI METALS TECHNOLOGIES SAS 51 rue Sibert SAINT CHAMOND F42400 France Surface inspection apparatus and defect detection apparatus for metallurgical and iron and steel products, for bands and sheets, namely, image acquisition cameras, electronic circuits for real time image acquisition interfaces, color cameras, charge-coupled device photo-electric sensors for self-emitted infrared light and for reflected visible light, charge-coupled device digital cameras and real time interfaces for charge-coupled device digital cameras, calculators for image acquisition, image display apparatus, namely, video screens and computer screens; real time image acquisition software, image recognition software, pattern recognition software, color recognition software, image contrast recognition software, data sorting software and data classification software for use with the aforementioned surface inspection detection apparatuses and defect detection apparatuses;Machine tools, namely, metalworking machine tools; machines, namely, electric machines for moving or positioning image acquisition apparatus;LED striplights;Computer programming;
VAI-QB SIEMENS VAI METALS TECHNOLOGIES SAS 51 rue Sibert SAINT CHAMOND F42400 France Surface inspection apparatus and defect detection apparatus for long metallurgical and iron and steel products, for bands and sheets, namely, image acquisition cameras, electronic circuits for real time image acquisition interfaces, color cameras, charge-coupled device photo-electric sensors for self-emitted infrared light and for reflected visible light, charge-coupled device digital cameras and real time interfaces for charge-coupled device digital cameras, calculators for image acquisition, image display apparatus, namely, video screens and computer screens; real time image acquisition software, image recognition software, pattern recognition software, color recognition software, image contrast recognition software, data sorting software and data classification software for use with the aforementioned surface inspection detection apparatuses and defect detection apparatuses;Computer programming;
XLINE CLECIM SAS 41 route de Feurs, CS 50099 France Surface inspection apparatus and defect detection apparatus for long metallurgical and iron and steel products, for bands and sheets, namely, image acquisition cameras, electronic circuits for real time image acquisition interfaces, color cameras, charge-coupled device photo-electric sensors for self-emitted infrared light and for reflected visible light, charge-coupled device digital cameras and real time interfaces for charge-coupled device digital cameras, calculators for image acquisition, image display apparatus, namely, video screens and computer screens; real time image acquisition software, image recognition software, pattern recognition software, color recognition software, image contrast recognition software, data sorting software and data classification software for use with the aforementioned surface inspection apparatuses and defect detection apparatuses;[ Computer programming ];
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. For the purpose of reducing a false report and shortening inspection time, an area to be inspected is locally inspected under optimum inspection conditions. In order to avoid the number of detected defects from increasing explosively, and thereby to facilitate control of a critical defect, general-purpose layout data, which is used for producing a mask of a semiconductor wafer, is accumulated in a design information server 2. With reference to the layout data, an area to be inspected, which is inspected by a pattern inspecting apparatus 1, is divided into partial inspection areas including a cell portion and a non-cell portion. Inspection parameters are set for each of the partial inspection areas. In addition, the defect reviewing apparatus 8 obtains an inspection result of the pattern inspecting apparatus 1. When obtaining a defect image, the defect reviewing apparatus 8 identifies a position, where the defect occurred, from among a cell portion, a non-cell portion, a pattern dense portion, and the like according to layout data. Moreover, the defect reviewing apparatus 8 sets inspection parameters, such as pickup magnification of this defect, in response to a result of the identification to set a control criterion of criticality.