SEMICONDUCTOR DEVICE TEST EQUIPMENT NAMELY

Brand	Owner	Address	Description
ALMA	WATKINS-JOHNSON COMPANY	3333 Hillview Avenue Palo Alto CA 94304	SEMICONDUCTOR DEVICE TEST EQUIPMENT-NAMELY, INTEGRATED CIRCUIT TESTERS;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A system for testing a semiconductor device and storing device test results in nonvolatile memory elements on the tested device, in which the semiconductor device includes logic circuitry which allows test results to be determined on the device. Test results are stored temporarily in one or more latch elements on the semiconductor device and are subsequently stored in nonvolatile memory elements. The invention eliminates the need for device testing equipment to perform a determination of test results and thus may simplify the design of test equipment. In one embodiment of the invention, passing test results are stored in a mixed code of set and unset nonvolatile memory elements such that the test results contain information about correct application of test signals as well as correct functioning of the semiconductor device.