SCIENTIFIC INSTRUMENTS MATERIALS CHARACTERIZATION

Brand Owner (click to sort) Address Description
ASAP MICROMERITICS INSTRUMENT CORPORATION 4356 Communications Drive Norcross GA 30093 scientific instruments for materials characterization, namely, surface area, pore size, pore volume, pore shape analyzers, and chemisorption analyzers used to perform chemical and physical adsorption tests;ACCELERATED SURFACE AREA AND POROSIMETRY;
AUTOPORE MICROMERITICS INSTRUMENT CORPORATION 4356 Communications Drive Norcross GA 30093 Scientific instruments for materials characterization * of the pores of absorbent materials, * namely, surface area, pore size, pore volume, pore shape, and density [ for pores of absorbent materials ];Class 9 should read Scientific instruments for materials characterization of the pores of absorbent materials, namely, surface area, pore size, pore volume, pore shape, and;AUTO PORE; AUTO POROSITY;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A polarization modulation photoreflectance technique has been developed for optical characterization of semiconductor electronic interfaces. By using a laser source in conjunction with polarization state modulation, a polarization modulation spectroscopy technique may be used to characterize the optical response of semiconductor materials and structures. Disclosed methods and instruments are suitable for characterization of optical signatures of electronic interfaces, including characterization of electric fields at semiconductor interfaces.