SCANNING PROBE MICROSCOPES ANALYZING

Brand	Owner	Address	Description
NANOVERSE	JPK Instruments AG	Colditzstraße 34-36, Germany	Scanning probe microscopes for analyzing sample surfaces on the nanometer scale by using a very sharp tip;NANO VERSE;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The present invention discloses a front-wing cantilever for the conductive probe of electrical scanning probe microscopes, wherein two symmetrical front wings are installed to extend from two lateral sides of the front end of the cantilever so that those two front wings are positioned on two lateral sides of the conductive tip. The front-wing structure of the cantilever can effectively inhibit the optical perturbation in the electrical scanning probe microscopes and obviously promote the analysis accuracy thereof. The front-wing structure can provide the scanned region with an effective dark field lest the optical absorption appears in the scanned region of semiconductor specimen and inhibit the optical perturbation occurs during the measurement and analysis of the differential capacitance.