PROBES TESTING INTEGRATED CIRCUITS

Brand	Owner (click to sort)	Address	Description
AU1000	KITA USA, Inc.	64 Water Street Attleboro MA 02703	Probes for testing integrated circuits; Probes for testing semiconductors; Test adapters for testing printed circuit boards; Test pins for testing printed circuit boards; Testing apparatus for testing printed circuit boards;AU 1000;
B. T. TECH	Chip Shine, Inc.	2070 Business Center Drive, Suite 140 Irvine CA 92612	probes for testing integrated circuits, namely, test probes and connector probes, electrical wiring devices in the nature of ic sockets, and electronic test machine, namely, current or high frequency electronic test machines, and systems comprised of continuity test apparatus for electrical circuits;TECH;
ELECTRONICS ACUPUNCTURE PROBE	Automotive Electronis Services, Inc.	3849 N Fine Ave #102 Fresno CA 93727	Probes for testing integrated circuits;ELECTRONICS AND PROBE;
GATORPROBE	Chait, Paul	455 Pinewood Dr. San Rafael CA 94903	Probes for testing integrated circuits for the purpose of testing the efficacy of finished product integrated circuits; Probes for testing semiconductors for the purpose of testing the efficacy of finished product semiconductors;
INTEGRAL SOCKETS	RIKA DENSHI AMERICA, INC.	112 Frank Mossberg Drive Attleboro MA 02703	Probes for testing integrated circuits;The mark consists of the wording INTEGRAL SOCKETS with a design element comprising a gray diamond shape enclosed by a larger black diamond shape, with a red integral symbol.;The color(s) gray, black and red is/are claimed as a feature of the mark.;INTEGRAL SOCKETS;

MICRO X ACT INC	MicroXact Inc	ekochergina@microxact.com 6580 Valley Center Drive, STE 312 Radford VA 241415696	Probes for testing integrated circuits; Probes for testing semiconductors; Semiconductor testing apparatus;
PICOPROBE	GGB Industries, Inc.	4196 Corporate Square Naples FL 34104	Probes for testing integrated circuits and semiconductors; microwave and oscilloscope probes for scientific purposes; probe tips, namely, tips specially adapted to fit probes for scientific purposes;PICO PROBE;
PPI	Prospect Products Inc.	43 Kelsey St Newington CT 06111	Probes for testing integrated circuits; Probes for testing semiconductors;PROSPECT PRODUCTS INCORPORATED;
PROSPECT PRODUCTS INC.	Prospect Products Inc.	43 Kelsey St Newington CT 06111	Probes for testing integrated circuits; Probes for testing semiconductors;
QALIBRIA	MPI CORPORATION	1-3F, NO.155, CHUNG-HO ST. CHU-PEI CITY HSINCHU COUNTY R.O.C. Taiwan	Probes for testing integrated circuits; Test pins for testing circuit boards; Probes for testing semiconductors; Probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; Probe cards for testing wafer; Testing apparatus for testing circuit boards; Testing apparatus for testing integrated circuits; Testing apparatus for testing semiconductors;
QALIBRIA	MPI CORPORATION	1-3F, NO.155, CHUNG-HO ST. CHU-PEI CITY HSINCHU COUNTY R.O.C. Taiwan	Probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing wafer; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; RF calibration software; computer software for driving probe card; computer software for testing semiconductor device; RF probes;
SENTIO	MPI CORPORATION	1-3F, NO.155, CHUNG-HO ST. CHU-PEI CITY HSINCHU COUNTY R.O.C. Taiwan	Probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing wafer; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; RF calibration software; computer software for driving probe card; computer software for testing semiconductor device; RF probes;
SHOTO	JohnsTech International Corporation	1210 New Brighton Boulevard Minneapolis MN 55413	Probes for testing integrated circuits; Test pins for testing printed circuit boards;
T-WAVE	FORMFACTOR, INC.	7005 Southfront Rd. Livermore CA 94551	probes for testing integrated circuits and semiconductors; probes for the measurement of electronic signals; probes for testing integrated circuits, namely, waveguide probes for on-wafer probing of circuits;
TWEEZEPROBE	Garcia, Ernesto	15858 Flamingo Dr Fontana CA 92337	Probes for testing integrated circuits;TWEEZE PROBE;
WAFERWALLET	MPI CORPORATION	1-3F, NO.155, CHUNG-HO ST. CHU-PEI CITY HSINCHU COUNTY R.O.C. Taiwan	probes for testing integrated circuits; test pins for testing circuit boards; probes for testing semiconductors; probe cards for use in connection with inspection of semiconductors and liquid crystal display panels; probe cards for testing semiconductor wafers; testing apparatus for testing circuit boards; testing apparatus for testing integrated circuits; testing apparatus for testing semiconductors; software for performing radiofrequency or RF calibration; computer software for driving probe card; computer software for testing semiconductor devices; probes for testing the radiofrequency or RF of semiconductors;Semiconductor wafer processing machines, namely, wafer loader;WAFER WALLET;
WHAT YOU NEED AT THE END OF YOUR LEAD	Chait, Paul	455 Pinewood Dr. San Rafael CA 94903	Probes for testing integrated circuits; Probes for testing semiconductors;
YARI	JohnsTech International Corporation	1210 New Brighton Boulevard Minneapolis MN 55413	Probes for testing integrated circuits; Test pins for testing printed circuit boards;
\|Z\| PROBE	FORMFACTOR BEAVERTON, INC.	9100 SW GEMINI DRIVE BEAVERTON OR 97008	probes for testing integrated circuits, semiconductors, and RF power devices; probes for the measurement of electronic signals; probes for testing integrated circuits, namely, waveguide probes for on-wafer probing of circuits;PROBE;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A testing device for testing integrated circuits is disclosed including a first board configured to connect to a specific integrated circuit being tested. A second board is removably connected to the first board and is configurable to test a variety of integrated circuits. An MCU located on the second board controls the testing of the specific integrated circuit being tested. At least one connector enables connection between the first board and the second board.