POWER SCAN

Brand	Owner (click to sort)	Address	Description
POWERSCAN	UTILITY TECHNICAL SERVICES	SUITE 2300 WCB 660 PLAZA DRIVE DETROIT MI 48226	POWER SCAN;TESTING AND INSPECTING INDUSTRIAL BATTERIES;THE LINING SHOWN IN THE DRAWING OF THE MARK IS A FEATURE OF THE MARK AND DOES NOT INDICATE COLOR.;
POWERSCAN	Third Wave Technologies, Inc.	502 South Rosa Road Madison WI 53719	POWER SCAN;reagents for characterization of nucleic acids, for research or scientific use;
POWERSCAN	Prescan, Inc.	1437 7th Street Suite 350 Santa Monica CA 90401	POWER SCAN;Providing services via website to allow consumers to design new products and then ascertain whether similar products are on the market or designed but not yet on the market, allow consumers to become informed of and compare existing product with designed but not yet available new product;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Scan architectures are commonly used to test digital circuitry in integrated circuits. The present invention describes a method of adapting conventional scan architectures into a low power scan architecture. The low power scan architecture maintains the test time of conventional scan architectures, while requiring significantly less operational power than conventional scan architectures. The low power scan architecture is advantageous to IC/die manufacturers since it allows a larger number of circuits (such as DSP or CPU core circuits) embedded in an IC/die to be tested in parallel without consuming too much power within the IC/die. Since the low power scan architecture reduces test power consumption, it is possible to simultaneously test more die on a wafer than previously possible using conventional scan architectures. This allows wafer test times to be reduced which reduces the manufacturing cost of each die on the wafer.