OPTIONAL OPTICAL MEASURING APPARATUS

Brand Owner (click to sort) Address Description
ELLIPSON NANOPHOTONICS GMBH GALILEO-GALILEI-STR. 28 55129 MAINZ Germany [Optional] *optical * measuring apparatus, in particular measuring apparatus to test the film thickness of electronic components such as silicon wafers;In the statement, Column 1, line 5, optional should be deleted, and, optical should be inserted.;
ELLIPSON NanoPhotonics AG Galileo-Galilei-Str. 28 55129 Mainz Germany [Optional] *optical * measuring apparatus, in particular measuring apparatus to test the film thickness of electronic components such as silicon wafers;In the statement, Column 1, line 5, optional should be deleted, and, optical should be inserted.;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An optical sheet is moved by a conveyor belt, and at least one beam is configured above the conveyor belt. When the beam is intersected by the moving optical sheet, the optical sheet is determined to be curled. The present invention achieves automatic in-line measuring of optical sheet curls by precise optical measurement and thus enhances measuring accuracy and raises measuring speed.