OPTICAL MEASURING INSTRUMENTS MEASURING

Brand	Owner	Address	Description
SOLR	LayTec Aktiengesellschaft	Seesener Str. 10-13 Berlin 10709 Germany	Optical measuring instruments for measuring, monitoring and controlling the covering processes, in particular during thin layer photovoltaic processes for manufacturing solar cells, which are based on copper, indium, gallium and sulphur, amorphous silicon, cadmium telluride, cadmium sulphide, organic or inorganic and other materials, namely measuring instruments based on specular spectral reflectometry with material aligned optical spectral range and with a single or multiple measuring heads integrated in the covering process (in-line application); apparatus for measuring, monitoring and controlling the layer thickness and refraction indices, the absorption coefficient, roughness, texture, conductivity, texture parameters and related optical parameters of the layers during the manufacturing of thin layer solar cells, namely optical spectral reflectometers for measuring, monitoring and controlling the physical parameters during manufacturing of thin layer solar cells;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

This invention is intended to reduce the cost by displaying the load information of a plurality of circuits with a single display device and transferring one of the two communication units in the measuring instruments from the measuring instruments to the display device to acquire the load information of a plurality of circuits. The display device and the measuring instruments are separated from each other, and the display device includes a plurality of communications units connectable with a plurality of devices, while each of many measuring instruments includes a single communication unit.