MICROWAVE TEST MEASUREMENT EQUIPMENT

Brand Owner (click to sort) Address Description
AUTOCAL ANRITSU COMPANY 490 Jarvis Drive Morgan Hill CA 95037 microwave test and measurement equipment, namely vector network analyzers, and parts thereof;
CABLE MATE WILTRON COMPANY 490 JARVIS DRIVE MORGAN HILL CA 950372809 microwave test and measurement equipment, specifically vector network analyzers, and parts thereof;
SPECTRUMMASTER WILTRON COMPANY 490 JARVIS DRIVE MORGAN HILL CA 950372809 microwave test and measurement equipment, specifically vector network analyzers, and parts thereof;
TUNE MODE WILTRON COMPANY 490 JARVIS DRIVE MORGAN HILL CA 950372809 microwave test and measurement equipment, namely vector network analyzers, and parts thereof;TUNE;
VNA POWER TOOLS WILTRON COMPANY 490 JARVIS DRIVE MORGAN HILL CA 950372809 microwave test and measurement equipment, specifically vector network analyzers, and parts thereof;VNA;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An apparatus and method for on-chip bias measurement of an analog signals on an integrated circuit with a switchable analog-to-digital converter capable of performing testing and other types of processing. Analog signal test locations are selected for testing by a test input selector which is in turn controlled by a controller on an integrated circuit, such as an imager chip. Test locations are connected to one or more analog-to-digital converters through the test input selector. The analog-to-digital converter(s) output a test measurement digital output to either test equipment or an on-chip calibration circuit. Test equipment or on-chip calibration circuits adjusts imager component bias or other operating parameters used in chip or device operation based on output from the analog-to-digital converter(s).