MICRO FINE

Brand Owner (click to sort) Address Description
MICRO-FINE TWEEZER REVLON CONSUMER PRODUCTS CORPORATION One New York Plaza New York NY 10004 MICRO FINE;tweezer;
MICROFINE GLCC LAUREL 199 Benson Road Middlebury CT 06749 MICRO FINE;CHEMICALS, NAMELY ANTIMONY OXIDE, BOTH FOR INDUSTRIAL AND GENERAL USE;
MICROFINE E. I. DU PONT DE NEMOURS AND COMPANY 974 Centre Road Wilmington DE 19805 MICRO FINE;FABRICS;THE CERTIFICATION MARK CERTIFIES THAT THE GOODS WITH WHICH THE MARK IS ASSOCIATED MEET THE CERTIFIER'S STANDARDS AS TO FIBER CONTENT, WEIGHT UNIFORMITY AND WATER REPELLANCY;
MICROFINE ROUSE HOLDINGS, INC. 1000 Rubber Way, 61 South Highway Vicksburg MS 39182 MICRO FINE;Resinous materials, namely, thermoplastic volcanizates for use in manufacturing, used for molded, extruded or cast applications in the automotive, construction, agricultural or sporting goods industries;
MICROFINE D&W FINE PACK 1372 North Old Laurens Road Fountain inn SC 29644 MICRO FINE;Plastic boxes; Plastic containers and covers for the food industry; Plastic containers and covers sold as a unit to the fast food industry for made to order food products;
MICROFINE Mazzuckelli, Brian 1040 W School St. Chicago IL 60657 MICRO FINE;Promoting the goods and services of eating establishments by providing an objective acknowledgment of quality to consumers; providing review, price comparison information, links to the web sites, and quality information regarding featured eating establishments;
MICROFINE SENSIENT COLORS 5600 W. RAYMOND STREET INDIANAPOLIS IN 46241 MICRO FINE;Colorants for use in the manufacture of food and beverage products; food coloring;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A pattern detection method and apparatus thereof for inspecting with high resolution a micro fine defect of a pattern on an inspected object and a semiconductor substrate manufacturing method and system for manufacturing semiconductor substrates such as semiconductor wafers with a high yield. A micro fine pattern on the inspected object is inspected by irradiating an annular-looped illumination through an objective lens onto a wafer mounted on a stage, the wafer having micro fine patterns thereon. The illumination light may be circularly or elliptically polarized and controlled according to an image detected on the pupil of the objective lens and image signals are obtained by detecting a reflected light from the wafer. The image signals are compared with reference image signals and a part of the pattern showing inconsistency is detected as a defect so that simultaneously, a micro fine defect or defects on the micro fine pattern are detected with high resolution. Further, process conditions of a manufacturing line are controlled by analyzing a cause of defect and a factor of defect which occurs on the pattern.