METROLOGY APPARATUS INSTRUMENTS

Brand Owner Address Description
REVO RENISHAW PLC NEW MILLS, WOTTON-UNDER-EDGE GLOUCESTERSHIRE GL128JR United Kingdom Metrology apparatus and instruments, namely, measuring apparatus and instruments, namely, automated inspection centres, namely, co-ordinate measuring machines; scanning apparatus, instruments and machines, other than for medical use; measuring probes for measuring co-ordinate positions on the surface of objects; scanning probes, other than for medical use; adapters, extension, joints, adjusting plates, styli, holders, contact modules, interfaces, probe heads, all for measuring probes and scanning probes; laser scanning probes; automatic probe exchange apparatus for automatically interchanging the probe mounted on a co-ordinate measuring machine; [ machine checking gauges for determining or improving the measurement performance of co-ordinate measuring machines; switches, power supplies, controls, battery chargers all for use with measuring apparatus and instruments, namely, automated inspection centres, namely, co-ordinate measuring machines;] replacement parts and fittings all for the aforesaid goods; all included in this class, the aforementioned goods relating to metrology equipment;Maintenance and repair of industrial and technical apparatus and instruments, namely, measuring apparatus and instruments, namely, automated inspection centres, namely, co-ordinate measuring machines;Color is not claimed as a feature of the mark.;Calibration of industrial and technical apparatus and instruments, namely, measuring apparatus and instruments [ and machine tools ], the aforementioned services relating to metrology equipment;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A method of generating a metrology recipe includes identifying regions of interest within a device layout. A coordinate list, which corresponds to the identified regions of interest, can be provided and used to create a clipped layout, which can be represented by a clipped layout data file. The clipped layout data file and corresponding coordinate list can be provided and converted into a metrology recipe for guiding one or more metrology instruments in testing a processed wafer and/or reticle. The experimental metrology results received in response to the metrology request can be linked to corresponding design data and simulation data and stored in a queriable database system.