MEASUREMENT ANALYSIS SYSTEMS COMPRISING

Brand Owner Address Description
JENTEK JENTEK Sensors, Inc. 121 Bartlett Street Marlborough MA 01752 measurement and analysis systems comprising electromagnetic inductive and capacitive and dielectrometer sensors, probes and sensor arrays, computer hardware, impedance analyzers, and data acquisition and analysis software, designed for measuring electrical properties, such as conductivity and permeability, of materials such as metal, composites and ceramics, and geometric properties, such as layer and coating thickness, of multilayered and coated manufactured goods such as aircraft skins, turbine blades, flat panel displays, semiconductors, and used for process and quality control of the manufacture of adhesives and metallic, graphite composite, ceramic, glass, paper, epoxy, and plastic parts, field inspection, namely, measurement of residual stress and monitoring age-related degradation, of structures, equipment and machinery such as bridges, aircraft components, turbine blades, automobile parts, nuclear and fossile fuel power plants, propellers, aircraft engine components and railway car components and rails, for object detection and discrimination such as detection of buried objects such as landmines, unexploded ordnance, archeological artifacts and environmental hazards, and for relating electrical properties of materials and manufactured goods, such as those mentioned above, to mechanical or other process properties, such as cure states, stress, temperature, fatigue life, corrosion state, heat treatment quality, wear, moisture content, porosity, contamination and residual protective capacity for filter materials;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Apparatus and methods for measuring gamma ray energy spectra wherein the gain of the measurement system is continuously and automatically adjusted to a standard gain. Gain of the system is controlled automatically through analysis of the measured energy spectra. Alternately, the gain of the system is controlled by the use of a calibration source and the operation of the system at a standard and amplified gain. Gain control can be improved further by combining both the spectral analysis and calibration source methodology. The system can be embodied in a wireline or logging-while-drilling borehole logging systems that measure naturally occurring or induced gamma ray spectra. The system can also be used in non-borehole applications including non-borehole gamma ray spectral systems such as computer-aided-tomography scan systems, security scanning systems, radiation monitoring systems, process control systems, analytical measurement systems using activation analysis methodology, and the like.