MEASUREMENT SYSTEMS

Brand Owner (click to sort) Address Description
ACCUNET TMA Technologies, Inc. 601 Haggerty Lane Bozeman MT 59715 measurement systems; namely, software driven distance and coordinate measurement instruments;ACCU-NET;
FMS Schmitt Measurement Systems, Inc. 2765 N.W. Nicolai St. Portland OR 97210 measurement systems, namely scatterometers used to deduce product characteristics such as surface roughness;
KEMA SMART CABLE GUARD DNV GL AS Veritasveien 1 Høvik 1363 Norway Measurement systems, consisting of instruments for measuring electrical discharge activity in cables; computer software for use in measuring and analysis of electrical discharge in cables;SMART CABLE GUARD;[Design for others in the field of measurement systems and product development of measurement systems; design and development of software and hardware; technical monitoring of network systems used for measuring apparatus, parts of electricity networks and cable networks and calibrating of measuring apparatus, parts of electricity networks and cable networks];
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. In order to perform a measurement operation of a pattern and a processing operation in parallel while the positions of two substrate stages are accurately measured and wire/hose units are prevented from becoming tangled, a substrate processing apparatus includes an alignment system for measuring the pattern arrangements of the substrates, a processing system disposed separately from the alignment system and used for processing the substrates, substrate stages which are able to support the substrates and move in an xy plane, and position measurement systems which measure the positions of the substrate stages. Four position measurement systems are arranged for the measurement in the x direction, and three position measurement systems are arranged for the measurement in the y direction. One of the position measurement systems for the measurement in the y direction is disposed at a side opposite to the remaining positioning measurement systems across the substrate stages.