MEASUREMENT EQUIPMENT MEASURING

Brand Owner (click to sort) Address Description
NANOSCAN ULTRATECH STEPPER, INC. 3050 Zanker Road San Jose CA 95134 measurement equipment for measuring the alignment between patterns on the front and back sides of a semiconductor wafer;NANO SCAN;
ULTRAMET ULTRATECH, INC. 3050 Zanker Road San Jose CA 95134 measurement equipment for measuring the alignment between patterns on the front and back sides of a semiconductor wafer for use during the manufacture of semiconductor devices, calibration masks for use with said measurement equipment, and manuals sold with said products;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An apparatus and method for measuring an item to be cut on a saw. The apparatus includes a backstop attached to a support surface, a first measuring means attached to the backstop for providing a lateral measurement of distance from a cutting means, a second measuring means for providing a measurement beyond a length of the backstop, and a third measuring means attached to the backstop for providing a measurement for vertical adjustment of the second measuring means. In one embodiment, the first and second measuring means are linear measurement scales, such as rulers, and the third measuring means, in yet another embodiment, is a coilable tape measure.