MARK COMPRISES CAPITAL

Brand Owner (click to sort) Address Description
C CRISA CORPORATION #805 101 E. PARK BLVD. PLANO TX 75074 THE MARK COMPRISES A CAPITAL C IN SCRIPT FORM IMPOSED UPON A SQUARE BLOCK.;C;CRYSTAL GIFTWARE AND BARWARE, NAMELY, CRYSTAL VASES, CRYSTAL BOWLS, CRYSTAL FIGURINES, CRYSTAL SCULPTURES, DECORATIVE CRYSTAL ARTICLES, NAMELY, ABSTRACT GEOMETRIC SHAPES AND FREEFORM SHAPES, CRYSTAL PITCHERS, CRYSTAL CANDLEHOLDERS, CRYSTAL CANDLESTICKS, CRYSTAL SAUCE BOATS, CRYSTAL SUGAR AND CREAMER SETS, CRYSTAL SALT AND PEPPER SETS, CRYSTAL TRAYS, CRYSTAL BUTTER DISHES, CRYSTAL DECANTERS, CRYSTAL GLASSES, CRYSTAL ICE BUCKETS, CRYSTAL MARTINI GLASSES, CRYSTAL HIGHBALL GLASSES, CRYSTAL OLD-FASHIONED GLASSES, AND CRYSTAL SHOT GLASSES;THE STIPPLING IN THE MARK AS SHOWN IN THE DRAWING IS INTENDED TO INDICATE SHADING; IT IS NOT INTENDED TO INDICATE COLOR.;
C CRISA CORPORATION #805 101 E. PARK BLVD. PLANO TX 75074 THE MARK COMPRISES A CAPITAL C IN SCRIPT FORM IMPOSED UPON A SQUARE BLOCK.;C;CRYSTAL GIFTWARE AND BARWARE, NAMELY, CRYSTAL VASES, CRYSTAL BOWLS, CRYSTAL FIGURINES, CRYSTAL SCULPTURES, DECORATIVE CRYSTAL ARTICLES, NAMELY, ABSTRACT GEOMETRIC SHAPES AND FREEFORM SHAPES, CRYSTAL PITCHERS, CRYSTAL CANDLEHOLDERS, CRYSTAL CANDLESTICKS, CRYSTAL SAUCE BOATS, CRYSTAL SUGAR AND CREAMER SETS, CRYSTAL SALT AND PEPPER SETS, CRYSTAL TRAYS, CRYSTAL BUTTER DISHES, CRYSTAL DECANTERS, CRYSTAL GLASSES, CRYSTAL ICE BUCKETS, CRYSTAL MARTINI GLASSES, CRYSTAL HIGHBALL GLASSES, CRYSTAL OLD-FASHIONED GLASSES, AND CRYSTAL SHOT GLASSES;THE STIPPLING IN THE MARK AS SHOWN IN THE DRAWING IS INTENDED TO INDICATE SHADING; IT IS NOT INTENDED TO INDICATE COLOR.;
TP TAPPAN COMPANY, THE Mansfield OH THE MARK COMPRISES THE CAPITAL LETTERS T AND P, PLACED VERTICALLY WITHIN A TRIANGLE. TP, PART OF THE MARK, IS THE ACRONYM FOR TAPPAN PART.;PT;GAS AND ELECTRIC RANGES AND OVENS, AND MICROWAVE OVENS FOR DOMESTIC AND COMMERCIAL USE, AND PARTS THEREOF;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The present invention provides an overlay mark for aligning different layers on a semiconductor wafer. The overlay mark comprises a bar-in-bar mark and two bar sets on the semiconductor wafer. The bar-in-bar mark comprises an inner bar mark positioned in one of the pre-layer and an outer bar mark positioned in the other pre-layer. The two bar sets are perpendicular to each other, and each of two bar sets comprises two parallel bars. The bars can be connected and the lengths of the bars can be the same or different.