ELECTRONIC PROBES SOCKET TESTERS

Brand	Owner (click to sort)	Address	Description
COAXPROBE	NHK Spring Co., Ltd.	10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 2360004 Japan	Electronic probes and socket testers for use in connection with testing the electrical properties of electronic probes, liquid-crystal panels and displays, semiconductors and semiconductor boards, integrated circuits, sockets for semiconductors; and parts therefore;COAX PROBE;
COILPIN	NHK Spring Co., Ltd.	10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 2360004 Japan	electronic probes and socket testers for use in connection with testing the electrical properties of electronic probes, liquid-crystal panels and displays, semiconductors and semiconductor boards, integrated circuits, sockets for semiconductors; and parts therefore, excluding coil pins;COIL PIN;
GLITTERPROBE	NHK SPRING CO., LTD	10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 236-0004 Japan	Electronic probes and socket testers for use in connection with testing the electrical properties of electronic probes, liquid-crystal panels and displays, semiconductors and semiconductor boards, integrated circuits, sockets for semiconductors; and parts thereof;GLITTER PROBE;
GLITTERTECHNOLOGY	NHK SPRING CO., LTD	10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 236-0004 Japan	Electronic probes and socket testers for use in connection with testing the electrical properties of electronic probes, liquid-crystal panels and displays, semiconductors and semiconductor boards, integrated circuits, sockets for semiconductors; and parts therefore;GLITTER TECHNOLOGY;
MICROCONTACTOR	NHK Spring Co., Ltd.	10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 2360004 Japan	Electronic probes and socket testers for use in connection with testing the electrical properties of electronic probes, liquid-crystal panels and displays, semiconductors and semiconductor boards, integrated circuits, sockets for semiconductors; and parts therefor, excluding micro contactors;MICRO-CONTACTOR;
SOCKETPIN	NHK Spring Co., Ltd.	10, Fukuura 3-chome, Kanazawa-ku, Yokohama-shi, Kanagawa 2360004 Japan	Electronic probes and socket testers for use in connection with testing the electrical properties of electronic probes, liquid-crystal panels and displays, semiconductors and semiconductor boards, integrated circuits, sockets for semiconductors; and parts therefor, excluding socket pins;SOCKET PIN;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

An electronic device is moved into a first position with respect to probes for making electrical contact with the device. The electronic device is then moved into a second position in which the electronic device is pressed against the probes, compressing the probes. The movement into the second position includes two components. One component of the movement tends to press the electronic device against the probes, compressing the probes and inducing a stress in the probes. The second movement tends to reduce that stress. Test data are then communicated to and from the electronic device through the probes.