DIAGNOSTIC KITS COMPRISING SPECIMEN RECEPTORS

Brand Owner (click to sort) Address Description
COLILERT IDEXX LABORATORIES, INC. One IDEXX Drive Westbrook ME 04092 DIAGNOSTIC KITS COMPRISING SPECIMEN RECEPTORS AND REAGENTS FOR TESTING FOR SELECTED BACTERIA SAMPLES;ISSUE NEW CERTIFICATE TO: Idexx Laboratories, Inc. One Idexx Drive Westbrook, ME 04092 Delaware Corporation;
DEFINED SUBSTRATE TECHNOLOGY IDEXX LABORATORIES, INC. One IDEXX Drive Westbrook ME 04092 diagnostic kits comprising specimen receptors and reagents for testing for selected bacteria in samples;ISSUE NEW CERTIFICATE TO: Idexx Laboratories, Inc. One Idexx Drive Westbrook, ME 04092 Delaware Corporation;SUBSTRATE TECHNOLOGY;
DST ACCESS MEDICAL SYSTEMS, INC. 21 BUSINESS PARK DRIVE BRANFORD CT 06405 diagnostic kits comprising specimen receptors and reagents for testing for selected bacteria in samples;
DST IDEXX LABORATORIES, INC. One IDEXX Drive Westbrook ME 04092 diagnostic kits comprising specimen receptors and reagents for testing for selected bacteria in samples;ISSUE NEW CERTIFICATE TO: Idexx Laboratories, Inc. One Idexx Drive Westbrook, ME 04092 Delaware Corporation;
ENVIRONETICS ACCESS MEDICAL SYSTEMS, INC. 21 BUSINESS PARK DRIVE BRANFORD CT 06405 diagnostic kits comprising specimen receptors and reagents for testing for selected bacteria in samples;ENVIRO-NETICS;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. This invention includes a method of integrating into a semiconductor specimen fabrication station a process diagnostic module that performs on the semiconductor specimen a processing operation that otherwise would not be performed by the processing components to thereby make the fabrication station more efficient and flexible to use. The process diagnostic module includes, for example, a specimen parameter measurement system or a specimen inspection system and is configured to mount on a front-opening interface mechanical standard (FIMS) load port and fits within the allowable spatial envelope. This invention further includes located external to the semiconductor specimen fabrication station a processor that receives and processes data acquired by the process diagnostic module during its operation.