CUSTOM MANUFACTURE FINISHING

Brand Owner (click to sort) Address Description
INTELICOAT TECHNOLOGIES COVERIS ADVANCED COATINGS US 700 Crestdale Road Matthews NC 28105 Custom manufacture and finishing of coated films, paper, laminates, and substrates;Optical film and microfilm;Coated and laminated substrates for use in electronic products, namely photoresist, dielectrics, polyurethane film for adhesive uses, flexible cirucit laminates, ceramic tapes, polyurethane and polyethylene foam, and adhesive sealants for general use;Specialty coatings, namely ink receptive coatings and toner receptive coatings;Packaging articles to the order and specification of others;TECHNOLOGIES;
ISECHROME ISE3 3211 MILL ROAD COLLEGEVILLE PA 19426 Custom manufacture and finishing of coated substrates for application in the automotive, commercial and residential furnishing, material science, engineering and industrial automation, aerospace and home appliance fields;INNOVATIVE SYSTEMS ENGINEERING CHROME;Coating compositions for applying a highly reflective finish to a substrate for application to finished products in the automotive, commercial and residential furnishing, material science, engineering and industrial automation, aerospace and home appliance fields;
THE LOUVER SHOP THE LOUVER SHOP HOLDINGS 1215 Palmour Drive, Suite 420 Gainesville GA 30501 Custom manufacture and finishing of interior shutters and blinds;Issue New Certificate to: The Louver Shop Holdings, LLC (Delaware Limited Liability Company) 1215 Palmour Drive Gainesville, Georgia 30501.;Installation of interior shutters and blinds;SHOP;
THE LOUVER SHOP The Louver Shop, Inc. 203 Chestera Road Dahlonega GA 30533 Custom manufacture and finishing of interior shutters and blinds;Issue New Certificate to: The Louver Shop Holdings, LLC (Delaware Limited Liability Company) 1215 Palmour Drive Gainesville, Georgia 30501.;Installation of interior shutters and blinds;SHOP;
TOUCH DESIGN RENAULT 92100 BOULOGNE-BILLANCOURT BOULOGNE-BILLANCOURT 92100 France CUSTOM MANUFACTURE AND FINISHING OF THE TEXTILE, LEATHER, AND FABRIC PORTIONS OF AUTOMOBILE INTERIORS; PROVIDING INFORMATION REGARDING THE CUSTOM MANUFACTURE AND FINISHING OF AUTOMOBILE INTERIORS' TEXTILE, LEATHER AND FABRIC COMPONENTS; SADDLERY WORK;LAND VEHICLES, NAMELY, AUTOMOBILES AND STRUCTURAL PARTS AND STRUCTURAL FITTINGS THEREFOR;RESEARCH AND DEVELOPMENT OF NEW PRODUCTS FOR THIRD PARTIES; MECHANICAL RESEARCH; TECHNICAL RESEARCH IN THE FIELD OF MOTOR VEHICLES; INDUSTRIAL DESIGN; ARCHITECTURAL DESIGN; ENGINEERING CONSULTATION; COMPUTER SOFTWARE DEVELOPMENT AND DESIGN FOR OTHERS; ENGINEERING; GRAPHIC ARTS DESIGN SERVICES;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An apparatus and method of using an in situ finishing information for finishing workpieces and semiconductor wafers are described. The method uses operative sensors such as friction sensors for detecting and improving control during finishing. The method can aid control of finishing while using in situ finishing information and cost of manufacture information. The method can aid control of finishing while using organic lubricants, lubricating films, and lubricating boundary layers in the operative finishing interface. The method can generally aid control of differential finishing such as when using differential lubricating films such as lubricating boundary layers. Control can generally aid improvement of differential finishing of workpieces such as semiconductor wafers. Planarization and localized finishing can be used with in situ finishing information such as differential lubricating boundary layer(s) for finishing. Defects can generally be reduced using in situ finishing information such as friction information and/or cost information. In situ improvements to cost of manufacture of a workpiece such as a semiconductor wafer using tracking and using in-process cost of manufacture information and/or cost of manufacture parameters are discussed. In situ improvements to cost of manufacture of a workpiece such as a semiconductor wafer using tracking and using in-process tracked information and/or cost of manufacture parameters are discussed. Methods and apparatus to change and/or improve in situ process control are discussed. Methods and apparatus to change and/or improve real-time process control are discussed. The semiconductor wafers can be tracked individually or by process group such as a process batch. Abrasive finishing surfaces can be used. Tribochemical finishing can generally be improved.