COMPUTER CONTROLLED AUTOMATIC TEST EQUIPMENT

Brand	Owner (click to sort)	Address	Description
COMPACT	WK Test Ltd	South Bersted Industrial Estate Bognor Regis PO22 9RL United Kingdom	COMPUTER CONTROLLED AUTOMATIC TEST EQUIPMENT FOR FUNCTIONAL TESTING OF ELECTRONIC BOARDS AND PRODUCTS;
EXORDIA	CIMITEK INTERNATIONAL INC.	CHANCERY CHAMBERS, HIGH STREET BRIDGETOWN Barbados	COMPUTER CONTROLLED AUTOMATIC TEST EQUIPMENT FOR FUNCTIONAL TESTING OF ELECTRONIC BOARDS AND PRODUCTS;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.