COMBINATION TESTING DEVICE BURN

Brand	Owner	Address	Description
AMBYX	Micron Technology, Inc.	8000 South Federal Way Boise ID 83707	combination testing device and burn-in oven for use with semiconductor integrated circuit devices;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

A reusable burn-in/test fixture for testing unsingulated dice on a semiconductor wafer consisting of two halves. The first half of the test fixture is a wafer cavity plate for receiving the wafer, and the second half establishes electrical communication between the wafer and electrical testing equipment. A rigid substrate has conductors thereon which establish electrical contact with the wafer. The test fixture need not be opened until the burn-in and electrical testing are completed. After burn-in stress and electrical testing, it is possible to establish interconnection between the single die or separate and package dice into discrete parts, arrays or clusters, either as singulated parts or as arrays.