BACTERIA KILLER

Brand Owner (click to sort) Address Description
BACTEKILLER KANEBO KABUSHIKI KAISHA (KANEBO, LTD.) No. 17-4, Sumida 5-chome Sumida-ku, Tokyo Japan BACTERIA KILLER;POLYESTER STAPLE FIBRES;
BACTEKILLER Fuji Chemical Industries, Ltd. 19-10, Shodaiotani 2-chome, Japan BACTERIA KILLER;ANTI-BACTERIAL CHEMICAL AGENTS WHICH ARE MIXED WITH THE RAW MATERIAL OF HIGH-MOLECULAR CHEMICALS, NAMELY; PACKING MATERIAL NAMELY, PLASTIC FILM FOR WRAPPING AND PLASTIC CASES; PAINTS, ADHESIVES, WATER FILTERS, WATER CONDITIONING MATERIAL, HAIR BRUSHES, TOOTH BRUSHES, FISHING NETS, KITCHEN WARE, NAMELY, PLASTIC CASES FOR FOOD STUFFS AND PLASTIC TABLE WARE, BATH ROOM GOODS, NAMELY, PLASTIC WASH BOWLS AND SPONGES, WOVEN AND KNITTED TEXTILES, YARN AND THREAD OF SYNTHETIC FIBERS AND SYNTHETIC FIBER ITSELF, AND PAPER PRODUCTS, NAMELY, CORRUGATED PAPER AND WALLPAPER, TO KEEP THEM FRESH AND PREVENT THEM FROM BECOMING MUSTY;
BACTEKILLER KANEBO KABUSHIKI KAISHA (KANEBO, LTD.) No. 17-4, Sumida 5-chome Sumida-ku, Tokyo Japan BACTERIA KILLER;POLYESTER SPUN YARN;
BACTEKILLER KANEBO TRINITY HOLDINGS, LTD. 20-20, KAIGAN, 3-CHOME MINATO-KU TOKYO Japan BACTERIA KILLER;ANTI-BACTERIAL CHEMICAL AGENTS WHICH ARE MIXED WITH THE RAW MATERIAL OF HIGH-MOLECULAR CHEMICALS, NAMELY; PACKING MATERIAL NAMELY, PLASTIC FILM FOR WRAPPING AND PLASTIC CASES; PAINTS, ADHESIVES, WATER FILTERS, WATER CONDITIONING MATERIAL, HAIR BRUSHES, TOOTH BRUSHES, FISHING NETS, KITCHEN WARE, NAMELY, PLASTIC CASES FOR FOOD STUFFS AND PLASTIC TABLE WARE, BATH ROOM GOODS, NAMELY, PLASTIC WASH BOWLS AND SPONGES, WOVEN AND KNITTED TEXTILES, YARN AND THREAD OF SYNTHETIC FIBERS AND SYNTHETIC FIBER ITSELF, AND PAPER PRODUCTS, NAMELY, CORRUGATED PAPER AND WALLPAPER, TO KEEP THEM FRESH AND PREVENT THEM FROM BECOMING MUSTY;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. A photomask evaluating method comprises calculating a killer defect rate function with respect to a simulative defect pattern including a pattern of photomask and a plurality of defects, the killer defect rate function representing a killer defect rate of the simulative defect pattern with respect to a desired density of the pattern and a desired size of the plurality of defects, calculating the number of killer defects in an inspection region of the photomask based on an area of the photomask inspection region, a pattern density in the inspection region, the killer defect rate function and a defect size distribution representing the number of defects per unit area to a defect size range acquired from a photomask manufacturing step, and evaluating the photomask based on the calculated number of the killer defects.