AUTOMATIC TEST BENCHES TESTING

Brand Owner (click to sort) Address Description
D.A.T.E. DEDICATED AUTOMATIC TEST EQUIPMENT CASSIDIAN TEST & SERVICES ZAC de la Clef Saint Pierre 1 Boulevard Jean Moulin Elancourt F-78990 France Automatic test benches for testing all types of electronic equipment for airplanes, tanks, missiles, and military uses, namely, cockpit electronics, display, flight control, flight management, weather radar, radio communication, radio navigation, satellite communication, satellite navigation, initial reference systems, electric generation, cabin pressure, cabin temperature, brake system, flight warning, engine control, flight data recorder, flight data management unit, air traffic management, traffic collision avoidance system, fuel system, ground proximity system, radio altimeter, air data system, radar, electronic warfare, optronic systems, weapon systems, sight systems, guidance systems, target seeking systems;DEDICATED AUTOMATIC TEST EQUIPMENT;
D.A.T.E. DEDICATED AUTOMATIC TEST EQUIPMENT EADS TEST & SERVICES (Société Anonyme) 37, boulevard de Montmorency F-75116 PARIS France Automatic test benches for testing all types of electronic equipment for airplanes, tanks, missiles, and military uses, namely, cockpit electronics, display, flight control, flight management, weather radar, radio communication, radio navigation, satellite communication, satellite navigation, initial reference systems, electric generation, cabin pressure, cabin temperature, brake system, flight warning, engine control, flight data recorder, flight data management unit, air traffic management, traffic collision avoidance system, fuel system, ground proximity system, radio altimeter, air data system, radar, electronic warfare, optronic systems, weapon systems, sight systems, guidance systems, target seeking systems;DEDICATED AUTOMATIC TEST EQUIPMENT;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. Test benches, simulations, and scripts are invoked in parallel for testing multiple points in a circuit being synthesized in an Analog Mixed Signal environment. A simulation system for simultaneously optimizing performance characteristics in circuit synthesis uses a set of design parameters. At least one circuit model is used to incorporate the set of design parameters, each circuit model adapted to model a portion of the circuit pertaining to a performance characteristic. At least one analysis test bench is then connected to each circuit model. Each analysis test bench is adapted to model circuitry external to the circuit and control the type of analysis to be performed for each performance characteristic of the circuit.