AUTOMATIC TESTING DEVICE METAL

Brand Owner Address Description
HALO FORTRESS TECHNOLOGY INC. 51 Grand Marshall Drive Toronto, Ontario M1B5N6 Canada automatic testing device for metal detectors;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. The cleaning device may clean probe elements. The probe elements may be the probe elements of a probe card testing apparatus for testing semiconductor wafers or semiconductor dies on a semiconductor wafer or the probe elements of a handling/testing apparatus for testing the leads of a packaged integrated circuit. During the cleaning of the probe elements, the probe card or the handler/tester is cleaned during the normal operation of the testing machine without removing the probe card from the prober. The cleaning device has a working surface with a particular characteristic (a matte finish or a conductive material) so that a prober is capable of automatically determining the location of the working surface of the cleaning device and therefore operate in an automatic cleaning mode.