AUTOMATIC TEST SYSTEMS

Brand	Owner (click to sort)	Address	Description
MICRO CONTROL COMPANY	MICRO CONTROL COMPANY	7956 Main Street NE Minneapolis MN 55432	Automatic test systems, comprised of a microcomputer, proprietary test software computer interfaces, power supply systems, a heat chamber and burn-in boards and connections, used in the manufacturing process to stress, burn-in and test semiconductors and other logic, memory or analysis devices;MICRO CONTROL COMPANY;The mark is lined to designate light blue, medium blue and dark blue in the stylized shapes to the left of the words Micro, Control and Company.;
MICRO CONTROL COMPANY	MICRO CONTROL COMPANY	7956 Main Street NE Minneapolis MN 55432	Automatic test systems, comprised of a microcomputer, proprietary test software, computer interfaces, power supply systems, a heat chamber and burn-in boards and connections, used in the manufacturing process to stress, burn-in, and test semiconductors and other logic, memory or analysis devices;MICROCOMPUTER CONTROL COMPANY;COMPANY;
OPENFLEX	Teradyne, Inc	NR700-2-3 600 Riverpark Drive North Reading MA 02038	Automatic test systems, equipment and components for electronic devices and data networks, namely, semiconductor chips, printed circuit boards, electronic assemblies;OPEN FLEX;
OPENFLEX CERTIFIED	Teradyne, Inc	NR700-2-3 600 Riverpark Drive North Reading MA 02038	Automatic test systems, equipment and components for electronic devices and data networks, namely, semiconductor chips, printed circuit boards, electronic assemblies, and data networks;OPEN FLEX CERTIFIED;CERTIFIED;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

The invention relates to a design analysis technique for a test pattern analysis of chips via automatic test equipment (ATE) or a circuit simulation to detect potential design weakness or abnormal behavior in real customer application faults. Problems are solved by comprising a simulation procedure stored in an LRT database of automatic test equipment (ATE), defining test conditions and test patterns which execute and generate continuously for a time given by a user, applying the test stimuli and test conditions to a device under test (DUT) and starting the long running test (LRT), stopping the test automatically if any application faults occur and logging the failure time and timely test sequence and starting another test again until a given maximum number of tests are reached.