AUTOMATED COUNTING PRODUCTION INFORMATION

Brand Owner (click to sort) Address Description
AUTO-COUNT AUTOMATION, INC. 100- 83rd Avenue NE Minneapolis MN 55432 AUTOMATED COUNTING AND PRODUCTION INFORMATION SYSTEMS, FOR USE WITH WEB PRESSES, PRINT SIGNATURE FEEDERS AND RELATED AUTOMATED/CONVEYOR OPERATIONS, COMPRISING MONITORS TO MEASURE PAPER USE, IDENTIFY PAPER ROLLS AND READ/PRINT BAR CODES, [ MONITORS TO COUNT AND CONTROL PRODUCTION, ] MONITORS TO REPORT INK CONSUMPTION, MONITORS TO LOG PRESS OPERATIONS, AND DATA MANAGEMENT SYSTEMS FOR USE THEREWITH, COMPRISING A DATA COMMUNICATIONS NETWORK AND REMOTE VIDEO DISPLAY;AUTOCOUNT;
AUTOMATION INC. AUTOMATION, INC. 100- 83rd Avenue NE Minneapolis MN 55432 AUTOMATED COUNTING AND PRODUCTION INFORMATION SYSTEMS, FOR USE WITH WEB PRESSES, PRINT SIGNATURE FEEDERS AND RELATED AUTOMATED/CONVEYOR OPERATIONS, COMPRISING MONITORS TO MEASURE PAPER USE, IDENTIFY PAPER ROLLS AND READ/PRINT BAR CODES, [ MONITORS TO COUNT AND CONTROL PRODUCTION, ] MONITORS TO REPORT INK CONSUMPTION, MONITORS TO LOG PRESS OPERATIONS, AND DATA MANAGEMENT SYSTEMS FOR USE THEREWITH, COMPRISING A DATA COMMUNICATIONS NETWORK AND REMOTE VIDEO DISPLAY;INC.;THE LINING IN THE DRAWING IS A FEATURE OF THE MARK AND DOES NOT INDICATE COLOR.;
AUTOMATION, INC. AUTOMATION, INC. 100- 83rd Avenue NE Minneapolis MN 55432 AUTOMATED COUNTING AND PRODUCTION INFORMATION SYSTEMS, FOR USE WITH WEB PRESSES, PRINT SIGNATURE FEEDERS AND RELATED AUTOMATED/CONVEYOR OPERATIONS, COMPRISING MONITORS TO MEASURE PAPER USE, INDENTIFY PAPER ROLLS AND READ/PRINT BAR CODES, MONITORS TO COUNT AND CONTROL PRODUCTION, MONITORS TO REPORT INK COMSUMPTION, MONITORS TO LOG PRESS OPERATIONS, AND DATA MANAGEMENT SYSTEMS FOR USE THEREWITH, COMPRISING A DATA COMMUNICATIONS NETWORK AND REMOTE VIDEO DISPLAY;INC.;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An automated, non-invasive method for classifying, detecting, and counting micropipes contained within silicon wafers, and generally any assortment of transparent wafers. Classifying, detecting, and counting micropipes takes place through the use of a data processing algorithm that incorporates information regarding: defect size; pit signature; area of pit signature when comparing a topography, specular, or scatter images; and detecting a tail within the standard pit signature. The method of the present invention teaches the development of a topography defect map, specular defect map, and scatter defect map for a complete analysis of the surface of a particular transparent wafer. Conventional detection, classification, and counting of micropipes involve characterization of micropipes in a manual fashion and rely upon an extremely invasive form of sample preparation. The method disclosed in the present invention is completely automated and non-invasive with regards to the treatment of the transparent wafer to be analyzed.