APPARATUS TESTING LARGE SCALE

Brand Owner (click to sort) Address Description
ADVAN-ELECTRON ADVANTEST CORPORATION 32-1, Asahicho 1-chome, Nerima-ku Tokyo Japan apparatus for testing large scale integrated (LSI) circuits; and measuring, control and data processing equipment for testing large scale integrated (LSI) systems;
ADVAN-STAR ADVANTEST CORPORATION 32-1, Asahicho 1-chome, Nerima-ku Tokyo Japan apparatus for testing large scale integrated (LSI) circuits; and measuring, control and data processing equipment for testing large scale integrated (LSI) systems;
ADVANNET ADVANTEST CORPORATION 32-1, Asahicho 1-chome, Nerima-ku Tokyo Japan apparatus for testing large scale integrated (LSI) circuits; and measuring, control and data processing equipment for testing large scale integrated (LSI) systems;ADVANTAGE NETWORK;
 

Where the owner name is not linked, that owner no longer owns the brand

    
Technical Examples
  1. An apparatus incorporating small-feature size and large-feature-size components. The apparatus comprise a strap including a substrate with an integrated circuit contained therein. The integrated circuit coupling to a first conductor disposed on the substrate. The first conductor is made of a thermosetting or a thermoplastic material including conductive fillers. A large-scale component having a second conductor is electrically coupled to the first conductor to electrically couple the large-scale component to the integrated circuit. The large-scale component includes a second substrate.