AD SCAN

Brand	Owner (click to sort)	Address	Description
ADSCAN	LUMICOM	27740 JEFFERSON AVENUE, SUITE 390 TEMECULA CA 92590	AD-SCAN;electronic status monitoring of outdoor advertising billboards to protect against vandalism and malfunction of billboards;
ADSCAN	RD HOLDINGS	11013 West Broad Street, Suite 300 Glen Allen VA 23060	AD SCAN;Customized data collection services, namely, data compiling and analysis relating to business management in the fields of product pricing, competitive activities of businesses, business operational factors, and the in-store consumer purchasing experience;
ADSCAN	RD HOLDINGS	11013 West Broad Street, Suite 300 Glen Allen VA 23060	AD SCAN;Customized data collection services, namely, data compiling and analysis relating to business management in the fields of product pricing, competitive activities of businesses, business operational factors, and the in-store consumer purchasing experience;Providing online non-downloadable software for retail intelligence and for analyzing content including data mining, data parsing, competitive activities, promotional analysis, competitive pricing, product linking, retail execution, distribution, exception reporting as it relates to the consumer shopping experience; Design, development, maintenance, and installation of software for retail intelligence and for analyzing content including data mining, data parsing, competitive activities, promotional analysis, competitive pricing, product linking, retail execution, distribution, exception reporting as it relates to the consumer shopping experience; technical support services, namely, installation, administration, and troubleshooting of software for retail intelligence and for analyzing content including data mining, data parsing, competitive activities, promotional analysis, competitive pricing, product linking, retail execution, distribution, exception reporting as it relates to the consumer shopping experience;
	Where the owner name is not linked, that owner no longer owns the brand

Technical Examples

Disclosed is a method and apparatus for improved delay fault testing by optimizing the order of scan cells in a scan chain. The order of the scan cells is determined by using a cost value for an order of scan cells, the cost value being computed from costs assigned to orderings of individual pairs of scan cells. These costs can be based on the number of faults that are untestable when the pair of scan cells are placed consecutively in the scan chain. The disclosed techniques allow for enhanced delay fault coverage by rearranging scan flip-flops without increasing routing overhead.